公开(公告)号：US11281530B2

公开(公告)日：2022-03-22

申请号：US17034656

申请日：2020-09-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Rengaraja Sudarmani ,  Prathiksha Gautham ,  Uday Kumar N B ,  Abhinav Sharma ,  Sachin Suresh Upadhya

IPC: G06F11/10 ,  G06F11/27 ,  G06F11/07 ,  G06F11/263 ,  G06F11/30 ,  G06F11/277

Abstract: The present invention relates to a method of validating a memory device. The method includes validating a second memory device based on one or more first microcode instructions stored in a validated predetermined part of a first memory device to detect the operational status of the second memory device. Further, the method includes receiving one or more second microcode instructions upon validating the second memory device. Finally, validating the first memory device based on the one or more second microcode instructions stored in the second memory device to detect the operational status of the first memory device.