公开(公告)号：US20230004778A1

公开(公告)日：2023-01-05

申请号：US17857731

申请日：2022-07-05

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sai Karthikey PENTAPATI ,  Amit SHUKLA ,  Kinsuk DAS ,  Raj Narayana GADDE ,  Sandeep MISHRA ,  Sarvesh ,  Sandeep PALAKKAL

IPC: G06N3/04 ,  G06K9/62 ,  G06F7/76

Abstract: The disclosure relates to method and system for on-device inference in a deep neural network (DNN). The method comprises: determining whether one or more layers of the DNN satisfy one of a first, a second and a third condition, the one or more layers including one or more convolution layers and one or more resampling layers; performing the on-device inference based on the determination, wherein performing the on-device inference comprises at least one of: optimizing the one or more convolution layers in the one or more parallel branches based on the one or more layers of the DNN satisfying the first condition, optimizing the at least one of the resampling layers based on the one or more layers of the DNN satisfying the second condition, and modifying operation of the at least one of the resampling layers based on the one or more layers of the DNN satisfying the third condition.