公开(公告)号：US20160070381A1

公开(公告)日：2016-03-10

申请号：US14750079

申请日：2015-06-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： JUNCHUL PARK ,  BUMSOO KIM ,  HYUNKYU OUH ,  SANG-HYUB KANG ,  CHADONG KIM ,  SANHO BYUN ,  JINCHUL LEE ,  YOON-KYUNG CHOI

IPC: G06F3/044 ,  H03K3/013

CPC classification number: G06F3/044 ,  G06F3/0416 ,  G06F3/0418

Abstract: Provided are a semiconductor device and a semiconductor system, which can increase immunity against noises through tertiary correlated double sampling (CDS). The semiconductor device includes an amplifier that receives noise and a driving signal, resets for each predetermined period of the driving signal and samples the noise to generate first sampled noise. The first sampled noise includes multiple noise differences each occurring between consecutive reset points. A sampler performs second sampling and third sampling on the first sampled noise and performs fourth sampling on the second and third sampled noises. The first sampled noise includes first to third noise differences, the second sampled noise is a difference between the first and second noise differences, the third sampled noise is a difference between the second and third noise differences, and the fourth sampled noise is a difference between the second and third sampled noises.

Abstract translation: 提供半导体器件和半导体系统，其可以通过三相关双倍采样（CDS）增强对噪声的抗扰度。 半导体器件包括接收噪声和驱动信号的放大器，针对驱动信号的每个预定周期复位并对噪声进行采样以产生第一采样噪声。 第一采样噪声包括在连续复位点之间发生的多个噪声差异。 采样器对第一采样噪声进行第二采样和第三采样，并对第二和第三采样噪声进行第四采样。 第一采样噪声包括第一至第三噪声差，第二采样噪声是第一和第二噪声差之间的差，第三采样噪声是第二和第三噪声差之间的差，第四采样噪声是 第二和第三采样噪声。