公开(公告)号：US20210036788A1

公开(公告)日：2021-02-04

申请号：US16665145

申请日：2019-10-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Palani Kumar SUBRAMANIAN ,  Kumud SINHA ,  Tushar VRIND

IPC: H04B17/15 ,  H04B17/29

Abstract: A method is provided. The method includes determining, in a determination by an electronic testing device, one or more locations in a cellular network where a test case is to be executed, a time at which the test case is to be executed at the one or more locations, a number of times the test case is to be executed at the one or more locations, or a type of a test equipment on which the test case is to be executed. A test context for testing a user equipment is determined based on a result of the determination. An optimal test case is determined from a test case repository, based on the test context, and the optimal test case is executed.