公开(公告)号：US20140105357A1

公开(公告)日：2014-04-17

申请号：US14046227

申请日：2013-10-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seung-woo SHIN ,  Jeong-hwan KIM ,  Do-kwan OH ,  Dong-jae LEE ,  Sang-chul LEE

IPC: A61B6/00

CPC classification number: A61B6/4452 ,  A61B6/4435 ,  A61B6/5241

Abstract: An X-ray apparatus includes: a source for emitting X-rays to an object; a detector for detecting the X-rays penetrating the object; an arm for connecting the source to the detector and moving the detector up and down according to a rotation of the source; and a controller for controlling an imaging of the object by driving the arm.

Abstract translation: X射线装置包括：用于向物体发射X射线的光源; 用于检测穿透物体的X射线的检测器; 用于将源连接到检测器并根据源的旋转使检测器上下移动的臂; 以及控制器，用于通过驱动臂来控制物体的成像。

公开(公告)号：US20150282776A1

公开(公告)日：2015-10-08

申请号：US14741843

申请日：2015-06-17

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seung-woo SHIN ,  Jeong-hwan KIM ,  Do-kwan OH ,  Dong-jae LEE ,  Sang-chul LEE

IPC: A61B6/00

CPC classification number: A61B6/5205 ,  A61B6/4435 ,  A61B6/4452 ,  A61B6/5241

Abstract: An X-ray apparatus includes: a source configured to emit X-rays to an object; a detector configured to detect the X-rays that have penetrated the object; an arm configured to connect the source to the detector and move centering on a stand fixed to a bottom; a controller configured to control a movement of the arm so that the controller changes a direction of the X-rays, which are radiated to the object, and the arm rotates on the stand to move the detector in a first direction, to obtain images for a plurality of parts of the object; and an image processor configured to obtain the images for the plurality of parts of the object based on the X-rays detected by the detector.

Abstract translation: X射线装置包括：被配置为向对象发射X射线的源; 检测器，其被配置为检测已经穿透所述物体的X射线; 臂构造成将源连接到检测器并且以固定到底部的支架为中心移动; 控制器，被配置为控制所述臂的运动，使得所述控制器改变被辐射到所述物体的X射线的方向，并且所述臂在所述支架上旋转以沿所述第一方向移动所述检测器，以获得用于 物体的多个部分; 以及图像处理器，被配置为基于由检测器检测到的X射线来获得对象的多个部分的图像。