公开(公告)号：US10353000B2

公开(公告)日：2019-07-16

申请号：US15479310

申请日：2017-04-05

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Doo-Seok Yoon ,  Min-Su Kim ,  Chung-Hee Kim ,  Dae-Seong Lee ,  Hyun Lee ,  Matthew Berzins ,  James Lim

IPC: G01R31/3177 ,  H03K3/037 ,  G01R31/317

Abstract: A multi-bit flip-flop includes: a single scan input pin to receive a scan input signal, a plurality of data input pins to receive first and second data input signals, a first scan flip-flop to select one of the scan input signal and the first data input signal as a first selection signal in response to a scan enable signal and to latch the first selection signal to provide a first output signal, a second scan flip-flop to select one of an internal signal corresponding to the first output signal and the second data input signal as a second selection signal in response to the scan enable signal and to latch the second selection signal to provide a second output signal, and a plurality of output pins to output the first and second output signals, wherein scan paths of the first and second scan flip-flops are connected to each other.