公开(公告)号：US10404931B2

公开(公告)日：2019-09-03

申请号：US15520634

申请日：2015-11-05

Applicant: SAFRAN ELECTRONICS & DEFENSE SAS

Inventor： Dominique Maltese ,  Mathieu Oudinot ,  Quentin Perdriau ,  Thomas Devichi

IPC: H04N5/367

Abstract: A defective-pixel detection method included in an image-processing procedure, including a pixel-processing procedure applied to pixels of an image supplied by an image sensor. Each pixel is associated with a classification value representing a state of said pixel. The method includes, for each pixel: applying the pixel-processing procedure; analyzing a result of the pixel-processing procedure; in the event of obtaining an unusual result representing a defect on a photosite of the image sensor that supplied said pixel, incrementing a number of detections of an unusual result for said pixel; and associating said pixel with a classification value representing a defective pixel when said number reaches a first threshold.