公开(公告)号：US20240094064A1

公开(公告)日：2024-03-21

申请号：US18353255

申请日：2023-07-17

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Tadashi KAMEYAMA ,  Fumiki KAWAKAMI ,  Tetsuhiro KOYAMA ,  Masataka MINAMI

IPC: G01K13/00 ,  G01K7/16

CPC classification number: G01K13/00 ,  G01K7/16 ,  G01K2219/00

Abstract: Before a temperature characteristic of a band gap reference circuit is tested, temperature dependencies of a reference voltage and an absolute temperature proportional voltage for a plurality of samples are measured. When the temperature characteristic is tested, based on a difference ΔVref between the reference voltage of the band gap reference circuit at a predetermined temperature and a median value of the reference voltages of the plurality of samples, a difference ΔVptat between the absolute temperature proportional voltage of the band gap reference circuit at a predetermined temperature and a median value of the absolute temperature proportional voltages of the plurality of samples is calculated.

公开(公告)号：US20150162927A1

公开(公告)日：2015-06-11

申请号：US14628101

申请日：2015-02-20

Applicant: Renesas Electronics Corporation

Inventor： Fumiki KAWAKAMI ,  Naoki YADA ,  Hiroyuki TSUNAKAWA

IPC: H03M1/12

CPC classification number: H03M1/1205 ,  H03K5/14 ,  H03M1/00 ,  H03M1/12 ,  H03M1/122 ,  H03M1/1225

Abstract: The semiconductor integrated circuit device has: more than one analog port; an A/D conversion part operable to execute an A/D conversion process for converting an analog signal taken in through each analog port into a digital signal for each preset virtual channel; and an A/D conversion control part operable to control an action of the A/D conversion part. The A/D conversion control part includes: virtual channel registers on which correspondence between the virtual channel and the analog port can be set; and a scan-group-forming register on which a start position of a scan group and an end position thereof can be set. The A/D conversion control part controls the A/D conversion part to successively execute an A/D conversion process on a plurality of virtual channels from a virtual channel associated with the start pointer to a virtual channel associated with the end pointer.

Abstract translation: 半导体集成电路器件具有：多个模拟端口; A / D转换部分，用于执行A / D转换处理，用于将通过每个模拟端口摄取的模拟信号转换为每个预设虚拟通道的数字信号; 以及可操作以控制A / D转换部分的动作的A / D转换控制部分。 A / D转换控制部分包括：虚拟通道寄存器，虚拟通道与模拟端口之间的对应关系可设置在其上; 以及扫描组形成寄存器，其上可以设置扫描组的开始位置和其结束位置。 A / D转换控制部分控制A / D转换部分，从与起始指针相关联的虚拟通道到与终点指针相关联的虚拟通道连续执行多个虚拟通道上的A / D转换处理。

公开(公告)号：US20130201044A1

公开(公告)日：2013-08-08

申请号：US13762229

申请日：2013-02-07

Applicant: Renesas Electronics Corporation

Inventor： Fumiki KAWAKAMI ,  Naoki YADA ,  Hiroyuki TSUNAKAWA

IPC: H03M1/12

CPC classification number: H03M1/1205 ,  H03K5/14 ,  H03M1/00 ,  H03M1/12 ,  H03M1/122 ,  H03M1/1225

Abstract: The semiconductor integrated circuit device has: more than one analog port; an A/D conversion part operable to execute an A/D conversion process for converting an analog signal taken in through each analog port into a digital signal for each preset virtual channel; and an A/D conversion control part operable to control an action of the A/D conversion part. The A/D conversion control part includes: virtual channel registers on which correspondence between the virtual channel and the analog port can be set; and a scan-group-forming register on which a start position of a scan group and an end position thereof can be set. The A/D conversion control part controls the A/D conversion part to successively execute an A/D conversion process on a plurality of virtual channels from a virtual channel associated with the start pointer to a virtual channel associated with the end pointer.