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公开(公告)号：US10134139B2
公开(公告)日：2018-11-20
申请号：US15458488
申请日：2017-03-14
Applicant: QUALCOMM Incorporated
Inventor： Rahul Gulati , Alex Kwang Ho Jong , John Chi Kit Wong , Sanjay Gupta , Ike Ikizyan
Abstract: Techniques of this disclosure may include processing one or more regions-of-interest (ROI) of an input image through a model of a display processor, calculating a first data integrity check value on the one or more ROI of the input image after processing through the model, processing the input image by the display processor, calculating a second data integrity check value on the one or more ROI by the display processor after the display processor processes the input image, comparing the first data integrity check value to the second data integrity check value, and generating an interrupt if the comparison indicates that the first data integrity check value and the second data integrity check value do not match.
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公开(公告)号：US09955150B2
公开(公告)日：2018-04-24
申请号：US14864348
申请日：2015-09-24
Applicant: QUALCOMM Incorporated
Inventor： Rahul Gulati , John Chi Kit Wong , Pranjal Bhuyan , Sanjay Gupta , Hemang Jayant Shah
CPC classification number: H04N17/004 , B60K35/00 , G09G3/006
Abstract: A display processor of a display system may receive an image that includes a test pattern. An input checksum may be associated with the test pattern. Hardware units of the display processor may process the image. The display system may generate an output checksum based at least in part on the test pattern after processing of the image. The display system may detect a fault in the hardware units of the display processor based on determining a difference between the input checksum and the output checksum.
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公开(公告)号：US20180165814A1
公开(公告)日：2018-06-14
申请号：US15458488
申请日：2017-03-14
Applicant: QUALCOMM Incorporated
Inventor： Rahul Gulati , Alex Kwang Ho Jong , John Chi Kit Wong , Sanjay Gupta , Ike Ikizyan
IPC: G06T7/11
CPC classification number: G06T7/11 , G06T2207/20021 , G06T2207/20104 , G06T2207/30252
Abstract: Techniques of this disclosure may include processing one or more regions-of-interest (ROI) of an input image through a model of a display processor, calculating a first data integrity check value on the one or more ROI of the input image after processing through the model, processing the input image by the display processor, calculating a second data integrity check value on the one or more ROI by the display processor after the display processor processes the input image, comparing the first data integrity check value to the second data integrity check value, and generating an interrupt if the comparison indicates that the first data integrity check value and the second data integrity check value do not match.
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公开(公告)号：US20170094268A1
公开(公告)日：2017-03-30
申请号：US14864348
申请日：2015-09-24
Applicant: QUALCOMM Incorporated
Inventor： Rahul Gulati , John Chi Kit Wong , Pranjal Bhuyan , Sanjay Gupta , Hemang Jayant Shah
CPC classification number: H04N17/004 , B60K35/00 , G09G3/006
Abstract: A display processor of a display system may receive an image that includes a test pattern. An input checksum may be associated with the test pattern. Hardware units of the display processor may process the image. The display system may generate an output checksum based at least in part on the test pattern after processing of the image. The display system may detect a fault in the hardware units of the display processor based on determining a difference between the input checksum and the output checksum.
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