公开(公告)号：US11769740B2

公开(公告)日：2023-09-26

申请号：US17494747

申请日：2021-10-05

Applicant: QUALCOMM Incorporated

Inventor： Alan Lewis ,  Zhengming Fu ,  Nan Chen ,  Adam Polak ,  Laura Fuentes ,  Gregory Bullard ,  Mark Todorovich

IPC: H01L23/00 ,  H01L27/144 ,  G06F21/75

CPC classification number: H01L23/576 ,  G06F21/755 ,  H01L27/1443

Abstract: Various embodiments include integrated approaches to detecting attempts to breach system-level or chip-level security using photo-generated currents induced by lasers or other radiation sources. Various embodiments integrate photo-detection circuits with a secure processor or other circuit in such a manner that the response to a security attack is fast enough to prevent loss of secure or private information are described. Various embodiments include circuits capable of providing a permanent record of photocurrent detection.

公开(公告)号：US11047946B2

公开(公告)日：2021-06-29

申请号：US15974271

申请日：2018-05-08

Applicant: QUALCOMM Incorporated

Inventor： Nam Dang ,  Rajeev Jain ,  Swarna Navubothu ,  Alan Lewis ,  Martin Saint-Laurent ,  Tung Nang Pham ,  Joseph Terregrossa ,  Paras Gupta ,  Somasekhar Maradani

IPC: G01R35/00 ,  G01R19/25 ,  H03K5/003

Abstract: Aspects of the disclosure are directed to voltage-based current sensing. In accordance with one aspect, voltage-based current sensing may include performing a coarse calibration of a voltage based current sensor to determine a coarse offset; performing a fine calibration of the voltage based current sensor to determine a fine offset; performing a frequency calibration of the voltage based current sensor to determine a frequency offset; and performing a transfer function calibration of the voltage based current sensor to determine a sensor transfer function using one or more of the coarse offset, the fine offset and the frequency offset; and measuring a load current using the sensor transfer function.

公开(公告)号：US11145608B2

公开(公告)日：2021-10-12

申请号：US16359319

申请日：2019-03-20

Applicant: QUALCOMM Incorporated

Inventor： Alan Lewis ,  Zhengming Fu ,  Nan Chen ,  Adam Polak ,  Laura Fuentes ,  Gregory Bullard ,  Mark Todorovich

IPC: H01L23/00 ,  H01L27/144 ,  G06F21/75

Abstract: Various embodiments include integrated approaches to detecting attempts to breach system-level or chip-level security using photo-generated currents induced by lasers or other radiation sources. Various embodiments integrate photo-detection circuits with a secure processor or other circuit in such a manner that the response to a security attack is fast enough to prevent loss of secure or private information are described. Various embodiments include circuits capable of providing a permanent record of photocurrent detection.