公开(公告)号：US11928411B2

公开(公告)日：2024-03-12

申请号：US17484536

申请日：2021-09-24

Applicant: QUALCOMM Incorporated

Inventor： Lindsey Makana Kostas ,  Santanu Pattanayak ,  Tushit Jain

IPC: G06F30/3315 ,  G06N3/045 ,  G06F119/12

CPC classification number: G06F30/3315 ,  G06N3/045 ,  G06F2119/12

Abstract: Certain aspects of the present disclosure provide techniques for testing integrated circuit designs based on test cases selected using machine learning models. An example method generally includes receiving a plurality of test cases for an integrated circuit. An embedding data set is generated from the plurality of test cases. A respective embedding for a respective test case of the plurality of test cases generally includes a mapping of the respective test case into a multidimensional space. A plurality of test case clusters is generated based on a clustering model and the embedding data set. A plurality of critical test cases for testing the integrated circuit is selected based on the plurality of test case clusters. The integrated circuit is timed based on the plurality of critical test cases and a hard macro defining the integrated circuit.

公开(公告)号：US12135678B2

公开(公告)日：2024-11-05

申请号：US18041168

申请日：2021-04-23

Applicant: QUALCOMM INCORPORATED

Inventor： Uttkarsh Wardhan ,  Vishal Ghorpade ,  Sanku Mukherjee ,  Madan Krishnappa ,  Sanath Sreekanta ,  Pankhuri Agarwal ,  Santanu Pattanayak

IPC: G06F15/78 ,  G05B13/00

Abstract: The reliability of a data communication link may be analyzed and otherwise maintained by collecting a two-dimensional array representing a functional data eye, and using a convolutional neural network to determine a score of the functional data eye. The determined score may be compared with a threshold, and an action may be initiated based on the result of the comparison.