公开(公告)号：US20240117442A1

公开(公告)日：2024-04-11

申请号：US18490116

申请日：2023-10-19

Applicant: Postech Research and Business Development Foundation (POSTECH)

Inventor： Joon Won Park ,  Sourav Mishra ,  Changill Ban

IPC: C12Q1/6886

CPC classification number: C12Q1/6886 ,  C12Q2600/156 ,  C12Q2600/166

Abstract: Methods and apparatuses are disclosed for detecting a presence of a mismatched pair in an oligonucleotide duplex that is attached to a solid substrate using an atomic force microscope. In particular, methods and apparatuses of the invention allow qualitative and quantitative analysis of the presence of a mismatched pair in a sample of oligonucleotide duplex using an atomic force microscope comprising an AFM cantilever that includes a DNA mismatch repair protein. Methods and apparatuses of the invention allow detection of gene mutation without a need for amplification, labeling, or modification of the sample. Such apparatuses and methods can be used in a wide variety of clinical diagnostic applications including detection and/or analysis of biomarkers related to, but not limited to, cancer, trauma, sepsis, aseptic inflammation, myocardial infarction, stroke, transplantation, diabetes, sickle cell disease, as well as other clinical conditions.