Electronic device and debug mode triggering method

    公开(公告)号:US11461207B1

    公开(公告)日:2022-10-04

    申请号:US17525990

    申请日:2021-11-15

    Abstract: An electronic device, which can enter a debug mode, comprising: a plurality of buttons, wherein a layout of the buttons correspond to one of a first button layout and a second button layout; a processing circuit, configured to control the electronic device to enter a debug mode when at least two of the buttons are pressed to meet a predetermined button combination. The processing circuit controls the electronic device to perform a first test corresponding to the first button layout or to perform a second test corresponding to the second button layout to detect which one of the first button layout and the second button layout does the electronic device correspond to.

Patent Agency Ranking