Portable manipulator for stackable semiconductor test system
    1.
    发明授权
    Portable manipulator for stackable semiconductor test system 有权
    可堆叠半导体测试系统的便携式机械手

    公开(公告)号:US07312604B2

    公开(公告)日:2007-12-25

    申请号:US11192631

    申请日:2005-07-29

    CPC classification number: G01R31/2887

    Abstract: This invention provides a manipulator for positioning a test head relative to a prober or other reference. The manipulator has a frame; a linkage coupled to the frame and including first and second links having freedom of rotation about respective pivots and a third link coupled to the first and second links such that the third link has translational and rotational degrees of freedom of movement; and an adaptor coupled to the third link and configured to attach to a test head. The invention also provides a method of controlling the manipulator.

    Abstract translation: 本发明提供了一种用于相对于探测器或其它参考来定位测试头的操纵器。 机械手有一个框架; 联接到所述框架并且包括具有围绕相应枢轴的旋转自由的第一和第二连杆以及联接到所述第一和第二连杆的第三连杆,使得所述第三连杆具有平移和旋转自由度; 以及耦合到所述第三链路并被配置为附接到测试头的适配器。 本发明还提供了一种控制机械手的方法。

    PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM
    2.
    发明申请
    PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM 审中-公开
    用于堆叠半导体测试系统的便携式操纵器

    公开(公告)号:US20080100322A1

    公开(公告)日:2008-05-01

    申请号:US11963702

    申请日:2007-12-21

    CPC classification number: G01R31/2887

    Abstract: This invention provides a manipulator for positioning a test head relative to a prober or other reference. The manipulator has a frame; a linkage coupled to the frame and including first and second links having freedom of rotation about respective pivots and a third link coupled to the first and second links such that the third link has translational and rotational degrees of freedom of movement; and an adaptor coupled to the third link and configured to attach to a test head. The invention also provides a method of controlling the manipulator.

    Abstract translation: 本发明提供了一种用于相对于探测器或其它参考来定位测试头的操纵器。 机械手有一个框架; 联接到所述框架并且包括具有围绕相应枢轴的旋转自由的第一和第二连杆以及联接到所述第一和第二连杆的第三连杆,使得所述第三连杆具有平移和旋转自由度; 以及耦合到所述第三链路并被配置为附接到测试头的适配器。 本发明还提供了一种控制机械手的方法。

    Portable manipulator for stackable semiconductor test system

    公开(公告)号:US20070024296A1

    公开(公告)日:2007-02-01

    申请号:US11192631

    申请日:2005-07-29

    CPC classification number: G01R31/2887

    Abstract: This invention provides a manipulator for positioning a test head relative to a prober or other reference. The manipulator has a frame; a linkage coupled to the frame and including first and second links having freedom of rotation about respective pivots and a third link coupled to the first and second links such that the third link has translational and rotational degrees of freedom of movement; and an adaptor coupled to the third link and configured to attach to a test head. The invention also provides a method of controlling the manipulator.

    Manipulator apparatus with low-cost compliance
    4.
    发明授权
    Manipulator apparatus with low-cost compliance 失效
    低成本符合的机械手装置

    公开(公告)号:US06722215B2

    公开(公告)日:2004-04-20

    申请号:US10176261

    申请日:2002-06-18

    CPC classification number: G01R31/2887

    Abstract: A compliance assembly is disclosed for use in a semiconductor tester testhead stand. The compliance assembly includes an airspring having compliance along a plurality of axes and a containment vessel adapted for receiving the airspring. The containment vessel includes walls that, when the airspring is loaded, control the compliance along the plurality of axes.

    Abstract translation: 公开了用于半导体测试仪测试台的柔性组件。 顺应性组件包括具有沿着多个轴线的顺应性的空气弹簧和适于接收空气弹簧的容纳容器。 安全壳包括当空气弹簧加载时控制沿着多个轴的顺应性的壁。

    High fidelity electrical probe
    5.
    发明授权
    High fidelity electrical probe 失效
    高保真电探头

    公开(公告)号:US06940298B2

    公开(公告)日:2005-09-06

    申请号:US10262370

    申请日:2002-09-30

    CPC classification number: G01R1/067 G01R35/005

    Abstract: A probe assembly for use with a calibration/validation robot to calibrate/validate a plurality of semiconductor tester channels is disclosed. The probe assembly includes a bracket adapted for mounting to the robot and a probe element for engaging test points disposed on the semiconductor tester channels. A magnetic attach/release mechanism cooperates with the bracket and probe element to allow for the separation of the probe element from the bracket whenever the probe element meets a force that exceeds a predetermined value.

    Abstract translation: 公开了一种用于校准/验证机器人校准/验证多个半导体测试器通道的探针组件。 探针组件包括适于安装到机器人的支架和用于接合设置在半导体测试器通道上的测试点的探针元件。 当探针元件遇到超过预定值的力时,磁性附接/释放机构与支架和探针元件配合,以允许探针元件与支架分离。

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