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公开(公告)号:US20250013211A1
公开(公告)日:2025-01-09
申请号:US18709355
申请日:2022-06-29
Inventor: Naganori SHIRAKATA , Shun TAKAYANAGI , Taichi SATO , Takayuki TSUKIZAWA , Takeshi ARAI
IPC: G05B13/04
Abstract: The present disclosure relates to a technology for automatically and efficiently searching for a facility control parameter. One aspect of the present disclosure relates to an automatic parameter adjustment device comprising: a plurality of facility models that model a facility; a control parameter setter that sets a plurality of first control parameters for use in a first trial to the plurality of facility models, and set a second control parameter for use in the first trial to the facility; and a comparer that compares a model operation result of the first trial of the plurality of facility models under the plurality of first control parameters with an actual machine operation result of the first trial of the facility under the second control parameter, wherein the control parameter setter selects a control parameter for use in a second trial based on a first comparison result between the model operation result of the first trial and the actual machine operation result of the first trial.
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公开(公告)号:US20240167965A1
公开(公告)日:2024-05-23
申请号:US18551117
申请日:2022-03-10
Inventor: Takanobu OJIMA , Daisuke KAJITA , Takeshi ARAI , Shota KOSAKA , Kosuke MURAOKA
CPC classification number: G01N21/8851 , G06T7/001 , G06T11/60 , G06V10/761 , G06V20/70
Abstract: An inspection assistance system includes an image acquirer and an image creator. The image acquirer acquires a standard image about a target. The standard image is associated with a condition parameter set at a standard value. The condition parameter is set as a part of a process condition concerning a surface condition of the target. The image creator creates, by reference to the standard value, a plurality of evaluation images about the target by changing the condition parameter based on a predetermined image creation model and the standard image.
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