公开(公告)号：US12259405B2

公开(公告)日：2025-03-25

申请号：US18083539

申请日：2022-12-18

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong Kim ,  Jung In Park ,  Sung Gu Kim ,  Hee Tae Kim

IPC: G01R1/067 ,  F16M11/20 ,  F16M11/24

Abstract: An adjustment control device for precise measurement that controls an inspection equipment for inspecting an inspected object to perform precise measurement includes a lowering control unit that lowers the inspection equipment with respect to the inspected object, a rotation control unit that is coupled to the lowering control unit and that controls the lowering control unit to rotate the inspection equipment at a predetermined angle in left and right directions when viewed from a frontal point of view, and a forward and backward control unit that is disposed above the rotation control unit and that transmit a moving force to the rotation control unit to move the inspection equipment forward or forward on the inspected object.