公开(公告)号：US12035047B2

公开(公告)日：2024-07-09

申请号：US18083540

申请日：2022-12-18

Applicant: PAMTEK Co., Ltd.

Inventor： Jae Woong Kim ,  Jung In Park ,  Hyun Wook Shin ,  Kyung Sub Oh

IPC: G01M11/02 ,  G02B7/00 ,  G03B30/00 ,  G06V10/24 ,  G06V10/74 ,  H04N17/00 ,  H04N23/57 ,  H04N23/695

CPC classification number: H04N23/695 ,  G01M11/0242 ,  G02B7/005 ,  G03B30/00 ,  G06V10/242 ,  G06V10/245 ,  G06V10/761 ,  H04N17/002 ,  H04N23/57 ,  G06V2201/07

Abstract: A camera module inspection system and a method for operating the inspection system. More specifically, the inspection system can quickly check and correct the alignment of the camera module.