公开(公告)号：US12005890B2

公开(公告)日：2024-06-11

申请号：US17711836

申请日：2022-04-01

Applicant: OmniVision Technologies, Inc.

Inventor： Zhenfu Tian ,  Liang Zuo ,  Yan Li ,  Wen He ,  Satoshi Sakurai

IPC: H04N7/18 ,  B60W30/09 ,  B60W50/14 ,  G01S13/931

CPC classification number: B60W30/09 ,  B60W50/14 ,  G01S13/931 ,  B60W2420/403

Abstract: A failure detection circuit for an image sensor includes a first input node, an array of second input nodes, and an output stage. The first input node is coupled to a reference voltage. The array of second input nodes has each input node coupled to receive a signal from a bitline of a bitline array in an image sensor that includes an array of pixels with each pixel is coupled to at least one bitline of the bitline array. The output stage is coupled to generate an output voltage indicative of any of the second input nodes being lower than the reference voltage.