公开(公告)号：US20250159376A1

公开(公告)日：2025-05-15

申请号：US18938080

申请日：2024-11-05

Applicant: OMNIVISION TECHNOLOGIES, INC.

Inventor： Tiejun Dai ,  Bo Mu ,  Menghan Guo ,  Wenlei Yang ,  Qinyi Wang ,  Andreas Suess ,  Luis Eduardo Garcia Capel

IPC: H04N25/707 ,  H04N23/68 ,  H04N23/84 ,  H04N25/531 ,  H04N25/766 ,  H04N25/79

Abstract: Hybrid image sensors with video frame interpolation (and associated systems, devices, and methods) are disclosed herein. In one embodiment, an imaging system comprises one or more event vision sensor (EVS) pixels, and a plurality of CMOS image sensor (CIS) pixels. Each EVS pixel can be configured to capture event data corresponding to contrast information of light incident on the EVS pixel. Each CIS pixel can be configured to capture CIS data corresponding to intensity of light incident on the CIS pixel. The imaging system can further comprise a deblur circuit configured to deblur the CIS data captured by the plurality of CIS pixels using a first portion of the event data captured by the one or more EVS pixels, and a system processor configured to interpolate a video frame using the deblurred CIS data and all or a subset of the event data.

公开(公告)号：US20250159371A1

公开(公告)日：2025-05-15

申请号：US18938208

申请日：2024-11-05

Applicant: OMNIVISION TECHNOLOGIES, INC.

Inventor： Tiejun Dai ,  Bo Mu ,  Menghan Guo ,  Wenlei Yang ,  Qinyi Wang ,  Luis Eduardo Garcia Capel ,  Rui Jiang ,  Andreas Suess

IPC: H04N25/47 ,  H04N23/81 ,  H04N25/53 ,  H04N25/707 ,  H04N25/78

Abstract: Hybrid image sensors with on-chip image deblur (and associated systems, devices, and methods) are disclosed herein. In one embodiment, an image sensor includes (a) a plurality of CMOS image sensor (CIS) pixels configured to capture CIS data corresponding intensity of light incident on CIS pixels of the plurality of CIS pixels, (b) an event vision sensor (EVS) pixel configured to capture EVS data corresponding to events detected in light incident on the EVS pixel, and (c) a deblur circuit configured to generate deblurred image data based on the CIS data and an accumulation of events in the EVS data. The deblur circuit can be configured to compute the accumulation of events, such as using an event-based double integral model.