公开(公告)号：US10254334B2

公开(公告)日：2019-04-09

申请号：US16044007

申请日：2018-07-24

申请人： National Technology & Engineering Solutions of Sandia, LLC

发明人： Ryan Helinski ,  Lyndon G. Pierson ,  Edward I. Cole ,  Tan Q. Thai

IPC分类号： G01R31/28 ,  G01R31/317 ,  H03K19/003 ,  H04L9/32

摘要： Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.

公开(公告)号：US20180328984A1

公开(公告)日：2018-11-15

申请号：US16044007

申请日：2018-07-24

申请人： National Technology & Engineering Solutions of Sandia, LLC

发明人： Ryan Helinski ,  Lyndon G. Pierson ,  Edward I. Cole ,  Tan Q. Thai

IPC分类号： G01R31/28 ,  H04L9/32 ,  G01R31/317 ,  H03K19/003

CPC分类号： G01R31/2894 ,  G01R31/2856 ,  G01R31/31703 ,  G01R31/31708 ,  H03K19/003 ,  H04L9/3247 ,  H04L9/3255 ,  H04L9/3281

摘要： Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.