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公开(公告)号：US20230125477A1
公开(公告)日：2023-04-27
申请号：US17511443
申请日：2021-10-26
Applicant: NVIDIA Corporation
Inventor： Prakash Gurumurthy , Piyush C. Modi
Abstract: Apparatuses, systems, and techniques to facilitate feature detection of a manufactured object such as a PCB using combined images of said manufactured object. In at least one embodiment, an automated optical inspection system (AOI) comprising one or more neural networks can infer based, at least in part, on combined images of a PCB the existence of defects on said PCB.
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