GATHERING AND SAMPLING DEVICE AND INSPECTION APPARATUS

    公开(公告)号:US20180188138A1

    公开(公告)日:2018-07-05

    申请号:US15858829

    申请日:2017-12-29

    Abstract: A sampling device and an inspection apparatus are disclosed. In one aspect, an example gathering and sampling device includes a cylindrical outer housing and an inner housing disposed within the cylindrical outer housing, a cyclone chamber is formed between the cylindrical outer housing and the inner housing to generate a cyclone by injecting a gas flow into the cyclone chamber. The gathering and sampling device further includes an outer chamber body, and a plurality of gas injection orifices formed in the first inner housing end opening of the inner housing and configured to inject a gas towards a substantial center of a circular region defined by an end face of the first outer housing end opening of the cylindrical outer housing.

    Gathering and sampling device and inspection apparatus

    公开(公告)号:US10782211B2

    公开(公告)日:2020-09-22

    申请号:US15858829

    申请日:2017-12-29

    Abstract: A sampling device and an inspection apparatus are disclosed. In one aspect, an example gathering and sampling device includes a cylindrical outer housing and an inner housing disposed within the cylindrical outer housing, a cyclone chamber is formed between the cylindrical outer housing and the inner housing to generate a cyclone by injecting a gas flow into the cyclone chamber. The gathering and sampling device further includes an outer chamber body, and a plurality of gas injection orifices formed in the first inner housing end opening of the inner housing and configured to inject a gas towards a substantial center of a circular region defined by an end face of the first outer housing end opening of the cylindrical outer housing.

    Darkroom type security inspection apparatus and method

    公开(公告)号:US10281431B2

    公开(公告)日:2019-05-07

    申请号:US15271713

    申请日:2016-09-21

    Abstract: The present invention discloses darkroom type security inspection apparatus and method. An apparatus comprises a housing constituting a closed darkroom, and assemblies disposed inside the housing. The assemblies disposed inside the housing are communicated by fittings or connectors and comprises: a sampling assembly comprising a sample collecting unit and a conveyer unit configured to convey an object to be inspected into the sample collecting unit; a sample processing assembly configured to concentrate and analyze the sample; and, an inspecting assembly configured to inspect composition of the sample by means of a gas chromatographic-ion mobility spectrometer (GC-IMS) or a separated ion mobility spectrometer (IMS). The security inspection apparatus of the present invention can perform the sampling easy, rapidly and effectively and perform the inspection accurately and rapidly without destroying and unpacking an object to be inspected, and thus is suitable for requirements of on-site rapid inspection of forbidden items in the airport, customs and the likes.

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