公开(公告)号：US20230160936A1

公开(公告)日：2023-05-25

申请号：US17532532

申请日：2021-11-22

Applicant: NATIONAL INSTRUMENTS CORPORATION

Inventor： Martin Obermaier ,  Martin Laabs ,  Dirk Plettemeier ,  Marc Vanden Bossche ,  Thomas Deckert ,  Vincent Kotzsch ,  Johannes Dietmar Herbert Lange

IPC: G01R29/08

CPC classification number: G01R29/0871 ,  G01R29/0814

Abstract: A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.

公开(公告)号：US10257329B2

公开(公告)日：2019-04-09

申请号：US15700050

申请日：2017-09-08

Applicant: National Instruments Corporation

Inventor： Ahsan Aziz ,  Amal Ekbal ,  Vincent Kotzsch

IPC: H04L29/08 ,  H04W84/04

Abstract: A wireless communications apparatus includes first/second data source/sinks that respectively source/sink PDCP SDU and MAC PDU for transfer to/from a memory unit and hardware accelerators controlled by a control processor (CP). In response to sourcing transmit PDCP SDU for transfer to the memory unit, the CP controls the hardware accelerators to generate and write PDCP, RLC, MAC headers to the memory unit and assemble the generated headers and the transmit PDCP SDU from the memory unit into transmit MAC PDU for provision to the second data sink. In response to sourcing receive MAC PDU for transfer to the memory unit, the CP controls the hardware accelerators to decode PDCP, RLC MAC headers of the receive MAC PDU in the memory unit to determine locations of receive PDCP SDU in the memory unit and fetch the receive PDCP SDU from the determined locations for provision to the first data sink.

公开(公告)号：US11982699B2

公开(公告)日：2024-05-14

申请号：US17532532

申请日：2021-11-22

Applicant: NATIONAL INSTRUMENTS CORPORATION

Inventor： Martin Obermaier ,  Martin Laabs ,  Dirk Plettemeier ,  Marc Vanden Bossche ,  Thomas Deckert ,  Vincent Kotzsch ,  Johannes Dietmar Herbert Lange

IPC: H01Q21/06 ,  G01R29/08

CPC classification number: G01R29/0871 ,  G01R29/0814

Abstract: A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.