公开(公告)号：US20130043387A1

公开(公告)日：2013-02-21

申请号：US13657843

申请日：2012-10-22

Applicant: MOCHII, INC. (D/B/A VOXA)

Inventor： Christopher Su-Yan Own ,  Andrew Bleloch ,  Paul John Dabrowski

IPC: H01J37/26

CPC classification number: H01J37/153 ,  H01J37/26 ,  H01J2237/2614 ,  H01J2237/262

Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector comprising either a foil or a set of concentric elements corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be configured to operate in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode.

Abstract translation: 透射电子显微镜包括用于产生电子束的电子束源。 光束被提供以会聚电子束。 包括箔或一组同心元件的像差校正器校正至少球面像差的电子束。 提供试样保持器以将样品保持在电子束的路径中。 检测器用于检测透过样品的电子束。 透射电子显微镜可以被配置为在没有检测到电子束的零光束的暗场模式下操作。 显微镜也可能能够以非相干照明模式操作。

公开(公告)号：US20140284475A1

公开(公告)日：2014-09-25

申请号：US14258004

申请日：2014-04-21

Applicant: Mochii, Inc. (d/b/a Voxa)

Inventor： Christopher Su-Yan Own ,  Andrew Bleloch ,  William Andregg

IPC: H01J37/26

CPC classification number: H01J37/263 ,  H01J37/153 ,  H01J37/26 ,  H01J37/261 ,  H01J2237/2614 ,  H01J2237/262

Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio. Alternatively or in addition, the transmission electron microscope may be adapted to operate the specimen holder to move the specimen in relation to the beam optics during exposure or between exposures to operate the transmission electron microscope in an incoherent mode.

Abstract translation: 透射电子显微镜包括用于产生电子束的电子束源。 光束被提供以会聚电子束。 提供试样保持器以将样品保持在电子束的路径中。 检测器用于检测透过样品的电子束。 透射电子显微镜可以适于产生彼此基本上不相干的两个或更多个图像，存储图像，并将各个图像的相应像素处的振幅信号组合以提高信噪比。 或者或另外，透射电子显微镜可以适于操作样本保持器以在曝光期间或在曝光之间相对于光束光学元件移动样本，以以非相干模式操作透射电子显微镜。

公开(公告)号：US08748818B2

公开(公告)日：2014-06-10

申请号：US13759029

申请日：2013-02-04

Applicant: Mochii, Inc.

Inventor： Christopher Su-Yan Own ,  Andrew Bleloch ,  William Andregg

IPC: H01J37/26 ,  G01N23/02

CPC classification number: H01J37/263 ,  H01J37/153 ,  H01J37/26 ,  H01J37/261 ,  H01J2237/2614 ,  H01J2237/262

Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule.

Abstract translation: 透射电子显微镜包括用于产生电子束的电子束源。 光束被提供以会聚电子束。 像差校正器校正至少球面像差的电子束。 提供试样保持器以将样品保持在电子束的路径中。 检测器用于检测透过样品的电子束。 透射电子显微镜可以以非相干模式操作，并且可以用于在分子上定位物体的序列。

公开(公告)号：US08569694B2

公开(公告)日：2013-10-29

申请号：US13657843

申请日：2012-10-22

Applicant: Mochii, Inc.

Inventor： Christopher Su-Yan Own ,  Andrew Bleloch ,  Paul John Dabrowski

IPC: G01N23/00 ,  G01N23/02 ,  G01N13/12 ,  H01J37/26

CPC classification number: H01J37/153 ,  H01J37/26 ,  H01J2237/2614 ,  H01J2237/262

Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector comprising either a foil or a set of concentric elements corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be configured to operate in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode.

Abstract translation: 透射电子显微镜包括用于产生电子束的电子束源。 光束被提供以会聚电子束。 包括箔或一组同心元件的像差校正器校正至少球面像差的电子束。 提供试样保持器以将样品保持在电子束的路径中。 检测器用于检测透过样品的电子束。 透射电子显微镜可以被配置为在没有检测到电子束的零光束的暗场模式下操作。 显微镜也可能能够以非相干照明模式操作。

公开(公告)号：US20130146764A1

公开(公告)日：2013-06-13

申请号：US13759029

申请日：2013-02-04

Applicant: Mochii, Inc. (d/b/a Voxa)

Inventor： Christopher Su-Yan Own ,  Andrew Bleloch ,  William Andregg

IPC: H01J37/26

CPC classification number: H01J37/263 ,  H01J37/153 ,  H01J37/26 ,  H01J37/261 ,  H01J2237/2614 ,  H01J2237/262

Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule.

Abstract translation: 透射电子显微镜包括用于产生电子束的电子束源。 光束被提供以会聚电子束。 像差校正器校正至少球面像差的电子束。 提供试样保持器以将样品保持在电子束的路径中。 检测器用于检测透过样品的电子束。 透射电子显微镜可以以非相干模式操作，并且可以用于在分子上定位物体的序列。

公开(公告)号：US08921787B2

公开(公告)日：2014-12-30

申请号：US14258004

申请日：2014-04-21

Applicant: Christopher Su-Yan Own ,  William Andregg ,  Mochii, Inc.

Inventor： Christopher Su-Yan Own ,  Andrew Bleloch ,  William Andregg

IPC: G01N23/02 ,  G01N13/12 ,  H01J37/26

CPC classification number: H01J37/263 ,  H01J37/153 ,  H01J37/26 ,  H01J37/261 ,  H01J2237/2614 ,  H01J2237/262

Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio. Alternatively or in addition, the transmission electron microscope may be adapted to operate the specimen holder to move the specimen in relation to the beam optics during exposure or between exposures to operate the transmission electron microscope in an incoherent mode.

Abstract translation: 透射电子显微镜包括用于产生电子束的电子束源。 光束被提供以会聚电子束。 提供试样保持器以将样品保持在电子束的路径中。 检测器用于检测透过样品的电子束。 透射电子显微镜可以适于产生彼此基本上不相干的两个或更多个图像，存储图像，并将各个图像的相应像素处的振幅信号组合以提高信噪比。 或者或另外，透射电子显微镜可以适于操作样本保持器以在曝光期间或在曝光之间相对于光束光学元件移动样本，以以非相干模式操作透射电子显微镜。