公开(公告)号：US20250165397A1

公开(公告)日：2025-05-22

申请号：US18731232

申请日：2024-05-31

Applicant: Microchip Technology Incorporated

Inventor： Pitamber SHUKLA ,  Chris NORRIE ,  Igor ZIPER ,  Srinivas YELISETTI

IPC: G06F12/06

Abstract: A controller may determine, using a machine learning model, reliability characteristic data associated with memory cells of a non-volatile memory device. The machine learning model may be trained using characterization data that identifies different reliability characteristic of one or more non-volatile memory devices. The controller may group, based on the reliability characteristic data, a first portion of the memory cells of the non-volatile memory device in a first management group, and a second portion of the memory cells of the non-volatile memory device in a second management group. The controller may manage, based on the reliability characteristic data, background scanning and logical to physical mapping of the first management group of memory cells, and the second management group of memory cells.