Method for detecting and measuring a secondary material intermittently deposited to a moving substrate
    1.
    发明授权
    Method for detecting and measuring a secondary material intermittently deposited to a moving substrate 失效
    用于检测和测量间歇地沉积到移动衬底上的次级材料的方法

    公开(公告)号:US07116750B1

    公开(公告)日:2006-10-03

    申请号:US11004277

    申请日:2004-12-02

    CPC classification number: G01N23/06

    Abstract: A method for detecting and measuring regions of a secondary material deposited onto a moving substrate. The method employs an x-ray source for directing an x-ray beam at the moving substrate, and an x-ray detector to detect an amount of x-ray energy transmitted by the moving sheet of material. Areas of bare substrate will allow for different amounts of x-ray transmission than areas of the substrate containing the secondary material. These differences in transmission and/or absorption can be used to detect the location of a region of secondary material and to determine if it falls within an acceptable range. According to one particular embodiment of the present invention, the method can be used to analyze burn characteristic modifying bands of a secondary material intermittently and repeatedly deposited to a moving web of smoking article paper.

    Abstract translation: 一种用于检测和测量沉积在移动衬底上的二次材料的区域的方法。 该方法采用x射线源来引导移动的基底上的X射线束,以及x射线检测器,以检测由移动的材料片材传输的X射线能量的量。 裸基板的区域将允许与含有次级材料的基板的区域不同的x射线透射量。 传输和/或吸收中的这些差异可用于检测次级材料区域的位置并确定其是否在可接受的范围内。 根据本发明的一个具体实施方案,该方法可用于间歇地并重复地沉积到吸烟制品纸的移动网上的二次材料的燃烧特性修改带。

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