公开(公告)号：US20140154997A1

公开(公告)日：2014-06-05

申请号：US14054213

申请日：2013-10-15

Applicant: MediaTek Inc.

Inventor： Yen-Liang CHEN ,  Chun-Hsien PENG ,  Ying-Chou SHIH ,  Yu-An CHEN ,  Chun-Wei YANG

IPC: H04B17/00

CPC classification number: H04B17/0085 ,  H04B3/46 ,  H04B17/29

Abstract: An integrated circuit (IC) is provided. The IC includes an RF transmitter configured to generate an RF signal in response to a command signal from test equipment; an RF receiver configured to generate an evaluation signal according to the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result, wherein the test equipment is external to the IC.

Abstract translation: 提供集成电路（IC）。 IC包括：RF发射器，被配置为响应于来自测试设备的命令信号产生RF信号; RF接收器，被配置为根据RF信号生成评估信号，并将评估信号报告给测试设备，使得测试设备对评估信号进行测试分析以确定测试结果，其中测试设备是外部的 到IC。

公开(公告)号：US20150229415A1

公开(公告)日：2015-08-13

申请号：US14696807

申请日：2015-04-27

Applicant: MediaTek Inc.

Inventor： Yen-Liang CHEN ,  Chun-Hsien PENG ,  Ying-Chou SHIH ,  Yu-An CHEN ,  Chun-Wei YANG

IPC: H04B17/00 ,  H04B17/29

CPC classification number: H04B17/0085 ,  H04B3/46 ,  H04B17/29

Abstract: An integrated circuit (IC) is provided. The IC includes an RF transmitter configured to generate an RF signal in response to a command signal from test equipment; an RF receiver configured to generate an evaluation signal according to the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result, wherein the test equipment is external to the IC.

Abstract translation: 提供集成电路（IC）。 IC包括：RF发射器，被配置为响应于来自测试设备的命令信号产生RF信号; RF接收器，被配置为根据RF信号生成评估信号，并将评估信号报告给测试设备，使得测试设备对评估信号进行测试分析以确定测试结果，其中测试设备是外部的 到IC。