RF testing system using integrated circuit

    公开(公告)号:US10320494B2

    公开(公告)日:2019-06-11

    申请号:US15074978

    申请日:2016-03-18

    Applicant: MediaTek Inc.

    Abstract: An integrated circuit (IC) is provided. The IC includes an RF transmitter and an RF receiver. The RF transmitter is configured to generate an RF signal in response to an analog test signal from a test signal generator of a module circuitry that is external to the IC. The RF receiver is configured to generate an outgoing signal according to an input RF signal, and to report the outgoing signal to the module circuitry. The module circuitry performs a test analysis on the RF signal generated by the RF transmitter or on the outgoing signal generated by the RF receiver to determine a test result. The test result is reported to a test equipment having no RF instruments.

    RF testing system with parallelized processing

    公开(公告)号:US10069578B2

    公开(公告)日:2018-09-04

    申请号:US15071513

    申请日:2016-03-16

    Applicant: MediaTek Inc.

    Abstract: An integrated circuit (IC) is provided. The IC includes: an RF transmitter configured to generate an RF signal when the IC has entered a test mode; an RF receiver configured to receive the RF signal in the test mode; and a computation unit having a plurality of processing units that are parallelized to perform a test procedure of the IC according to the received RF signal to determine one or more test results.

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