System and method for the profiling and calibration of film scanners
    1.
    发明授权
    System and method for the profiling and calibration of film scanners 有权
    电影扫描仪的配置和校准系统和方法

    公开(公告)号:US08810645B2

    公开(公告)日:2014-08-19

    申请号:US13375031

    申请日:2009-06-01

    摘要: A system and method for calibrating a production film scanner is provided. The system and method provides for providing at least one first calibration frame on an intermediate film stock providing at least one second calibration frame on a negative film stock, scanning the at least first and second calibration frames with a reference film scanner, scanning the at least first and second calibration frames with a production film scanner, and determining a compensation calibration factor from a first result of the scanning with the reference film scanner and a second result of the production film scanner.

    摘要翻译: 提供了一种用于校准生产薄膜扫描仪的系统和方法。 该系统和方法提供在中间膜原料上提供至少一个第一校准框架,在负片材料上提供至少一个第二校准框架,用参考膜扫描仪扫描至少第一和第二校准框架,至少扫描 具有生产薄膜扫描仪的第一和第二校准框架,以及从参考胶片扫描仪的扫描的第一结果和生产薄膜扫描仪的第二结果确定补偿校准因子。

    SYSTEM AND METHOD FOR THE PROFILING AND CALIBRATION OF FILM SCANNERS
    2.
    发明申请
    SYSTEM AND METHOD FOR THE PROFILING AND CALIBRATION OF FILM SCANNERS 失效
    电影扫描仪配置和校准的系统和方法

    公开(公告)号:US20120069175A1

    公开(公告)日:2012-03-22

    申请号:US13375031

    申请日:2009-06-02

    IPC分类号: H04N9/11 H04N5/253

    摘要: A system and method for calibrating a production film scanner is provided. The system and method provides for providing at least one first calibration frame on an intermediate film stock, providing at least one second calibration frame on a negative film stock, scanning the at least first and second calibration frames with a reference film scanner, scanning the at least first and second calibration frames with a production film scanner, and determining a compensation calibration factor from a first result of the scanning with the reference film scanner and a second result of the production film scanner.

    摘要翻译: 提供了一种用于校准生产薄膜扫描仪的系统和方法。 该系统和方法提供了在中间膜原料上提供至少一个第一校准框架,在负片材料上提供至少一个第二校准框架,用参考薄膜扫描仪扫描至少第一和第二校准框架,扫描在 具有生产薄膜扫描仪的最少的第一校准框架和第二校准框架,以及用参考薄膜扫描器从扫描的第一结果和生产薄膜扫描器的第二结果确定补偿校准因子。