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公开(公告)号:US20240032493A1
公开(公告)日:2024-02-01
申请号:US18028173
申请日:2021-09-17
发明人: Xin SHEN , Aviral SHUKLA , Slobodan TRIFUNOVIC , Yiduo ZHAN , Zihao ZHAO
摘要: Systems and methods are provided for automatically allocating test protocols to a plurality of test locations. Once such method includes a computing device executing a first stage machine learning prediction model (MLPM) based on protocol data for multiple test protocols for a test experiment to generate a first stage output. The first stage MLPM is trained based on historical allocation data for one or more prior test experiments. Multiple test sets are associated with the test protocols, and the first stage output includes, for multiple test locations, allocation prediction scores for the test protocols. Based on the first stage output, the computing device executes a second stage optimization model to generate a second stage output. The second stage output includes an allocation plan for the test protocols. The allocation plan identifies one or more of the test locations for each of the test protocols.