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公开(公告)号:USD848883S1
公开(公告)日:2019-05-21
申请号:US29633004
申请日:2018-01-11
Applicant: MITUTOYO CORPORATION
Designer: Sadayuki Matsumiya , Yoshiro Asano , Masaru Kawazoe , Fumihiko Koshimizu , Shigeru Ohtani , Yu Sugai
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公开(公告)号:USD827459S1
公开(公告)日:2018-09-04
申请号:US29593538
申请日:2017-02-09
Applicant: MITUTOYO CORPORATION
Designer: Sadayuki Matsumiya , Takeshi Kawabata , Hidekazu Sano , Yu Sugai , Shigeru Ohtani
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公开(公告)号:US10001358B2
公开(公告)日:2018-06-19
申请号:US15281326
申请日:2016-09-30
Applicant: MITUTOYO CORPORATION
Inventor: Kazuhiko Hidaka , Nobuyuki Hama , Tatsuki Nakayama , Sadayuki Matsumiya
Abstract: A measuring probe for measuring a screw groove of a relatively rotatable ball screw includes a stylus having a tip end portion configured to contact the screw groove, a radial-direction displacement mechanism configured to support the stylus so as for the stylus to be displaceable in an X direction toward an axial center of the ball screw, an axial-direction displacement mechanism configured to support the stylus so as for the stylus to be displaceable in an axial direction (Z direction) of the axial center, and sensors configured to detect displacement of the stylus produced by the radial-direction displacement mechanism and the axial-direction displacement mechanism. This enables high-accuracy measurement of a predetermined position of a side surface of a relatively rotatable work.
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公开(公告)号:USD806586S1
公开(公告)日:2018-01-02
申请号:US29576286
申请日:2016-09-01
Applicant: MITUTOYO CORPORATION
Designer: Sadayuki Matsumiya , Yu Sugai , Shigeru Ohtani , Kenji Iwamoto , Ryohei Kanno , Atsushi Hattori , Takaharu Imura
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公开(公告)号:USD792251S1
公开(公告)日:2017-07-18
申请号:US29555537
申请日:2016-02-23
Applicant: MITUTOYO CORPORATION
Designer: Sadayuki Matsumiya , Shigeru Ohtani , Yuji Oura
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公开(公告)号:US09518811B2
公开(公告)日:2016-12-13
申请号:US14669667
申请日:2015-03-26
Applicant: MITUTOYO CORPORATION
Inventor: Takeshi Yamamoto , Sadayuki Matsumiya , Atsushi Shimaoka , Kazuhiko Hidaka , Tomoyuki Miyazaki , Yasunori Mori
Abstract: A measuring force includes a stem, an arm, a detector, a rotation fulcrum, and a measuring force adjuster. A probe which makes contact with a workpiece is provided on the stem. An end portion of the arm is joined to the stem. The rotation fulcrum acts as a fulcrum for a rotating motion of the stem and the arm. The detector detects a displacement amount of the rotating motion of the arm. A crossed spring of the rotation fulcrum imparts on the stem and the arm a torque around an axis of the rotating motion in accordance with the displacement amount of the rotating motion. The measuring force adjuster imparts on the arm and the stem a torque, in a reverse direction of the torque generated by the crossed spring, by an attraction force generated by a magnetic force between at least two magnetic members mutually arranged at opposite ends.
Abstract translation: 测量力包括杆,臂,检测器,旋转支点和测量力调节器。 在杆上设置与工件接触的探针。 臂的端部连接到杆。 旋转支点用作杆和臂的旋转运动的支点。 检测器检测臂的旋转运动的位移量。 旋转支点的交叉弹簧根据旋转运动的位移量,在杆和臂上施加围绕旋转运动的轴线的转矩。 测量力调节器通过由在相对端相互布置的至少两个磁性构件之间的磁力产生的吸引力,在与交叉弹簧产生的扭矩相反的方向上向臂和杆施加扭矩。
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公开(公告)号:US10197382B2
公开(公告)日:2019-02-05
申请号:US15724328
申请日:2017-10-04
Applicant: Mitutoyo Corporation
Inventor: Sadayuki Matsumiya , Kenji Okabe , Koji Kubo , Nobuya Kaneko
Abstract: A chromatic confocal sensor includes a light source portion that emits a plurality of light beams having different wavelengths; an objective lens that converges the plurality of light beams at different focal positions; an emission port from which measurement light reflected by an object to be measured at the focal positions out of the plurality of light beams is emitted; a position calculation portion that calculates a position of the object to be measured based on the emitted measurement light; an observation portion including an observation light source that emits observation light and an image sensor; and a beam splitter that emits at least a part of the measurement light that passes through the objective lens to the emission port and emits at least a part of the observation light that passes through the objective lens and is reflected by the object to be measured to the image sensor.
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公开(公告)号:USD790379S1
公开(公告)日:2017-06-27
申请号:US29553771
申请日:2016-02-04
Applicant: MITUTOYO CORPORATION
Designer: Sadayuki Matsumiya , Shigeru Ohtani , Kenji Iwamoto , Yasuhiro Tsujimoto , Atsuya Niwano
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公开(公告)号:USD740143S1
公开(公告)日:2015-10-06
申请号:US29514008
申请日:2015-01-07
Applicant: MITUTOYO CORPORATION
Designer: Yoshiro Asano , Sadayuki Matsumiya , Shigeru Ohtani , Atsuya Niwano , Shozaburo Tsuji
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公开(公告)号:USD727760S1
公开(公告)日:2015-04-28
申请号:US29501712
申请日:2014-09-08
Applicant: Mitutoyo Corporation
Designer: Sadayuki Matsumiya , Shigeru Ohtani , Yu Sugai , Kazuhiko Kimura , Takashi Gohma , Yoshifumi Saito
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