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公开(公告)号：US20170138998A1
公开(公告)日：2017-05-18
申请号：US15299484
申请日：2016-10-21
Applicant: MEDIATEK INC.
Inventor： Chih-Chun Lin , Chun-Chih Fan
CPC classification number: G01R31/043
Abstract: A testing device for a connection interface of an electronic device includes an interface module, comprising a plurality of pins for coupling to the connection interface of the connection interface; and a testing circuit, comprising at least one of a conducting path between a first pin and a second pin among the plurality of pins, a visualized module coupled to a third pin of the plurality of pins, and an impedance coupled to a fourth pin of the plurality of pins.
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