公开(公告)号：US20220165051A1

公开(公告)日：2022-05-26

申请号：US17430246

申请日：2020-04-24

Applicant: MAYEKAWA MFG. CO., LTD.

Inventor： Koutarou TOKUYAMA ,  Hiroaki MURANAMI ,  Tomoki YAMASHITA ,  Masaru TOKUMOTO ,  Tatsuya UMINO

IPC: G06V10/77 ,  G06V10/764 ,  G06V10/75 ,  G06V10/30

Abstract: According to this feature point recognition system (1), data of a feature point of a first group obtained by a first algorithm calculation unit (12) with no mask processing is compared with data of a feature point of a second group detected by a third algorithm calculation unit (16) obtained through mask processing performed by a second algorithm calculation unit (14), whether the data is abnormal is determined, and thereby feature points of a subject P can be recognized more accurately and stably than in the related art.