公开(公告)号：US12295753B2

公开(公告)日：2025-05-13

申请号：US17973672

申请日：2022-10-26

Applicant: LUNIT INC.

Inventor： Donggeun Yoo ,  Sanghyup Lee ,  Minchul Kim ,  Hanjun Lee ,  Sunggyun Park

IPC: A61B6/00 ,  A61B5/00 ,  G06T7/00

Abstract: A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.

公开(公告)号：US11844632B2

公开(公告)日：2023-12-19

申请号：US18177266

申请日：2023-03-02

Applicant: LUNIT INC.

Inventor： Donggeun Yoo ,  Sanghyup Lee ,  Minchul Kim ,  Hanjun Lee ,  Sunggyun Park

IPC: G06T7/00 ,  A61B6/00 ,  A61B5/00

CPC classification number: A61B5/7264 ,  A61B6/5217 ,  G06T7/0012

Abstract: A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.