METHOD AND SYSTEM FOR TRAINING MACHINE LEARNING MODEL FOR DETECTING ABNORMAL REGION IN PATHOLOGICAL SLIDE IMAGE

    公开(公告)号:US20220262513A1

    公开(公告)日:2022-08-18

    申请号:US17550034

    申请日:2021-12-14

    Applicant: LUNIT INC.

    Abstract: A method, performed by at least one processor, for training a machine learning model for detecting an abnormal region in a pathological slide image is disclosed. The method including receiving one or more first pathological slide images, determining, from the received one or more first pathological slide images, a normal region based on an abnormality condition indicative of a condition of an abnormal region, generating a first set of training data including the determined normal region, generating the abnormal region by performing image processing corresponding to the abnormality condition with respect to at least partial region in the received one or more first pathological slide images, and generating a second set of training data including the generated abnormal region.

Patent Agency Ranking