DESIGN AND DEPLOYMENT OF CUSTOM SHIFT ARRAY MACRO CELLS IN AUTOMATED APPLICATION SPECIFIC INTEGRATED CIRCUIT DESIGN FLOW
    1.
    发明申请
    DESIGN AND DEPLOYMENT OF CUSTOM SHIFT ARRAY MACRO CELLS IN AUTOMATED APPLICATION SPECIFIC INTEGRATED CIRCUIT DESIGN FLOW 有权
    自动应用特定集成电路设计流程中自定义移动阵列宏块的设计与部署

    公开(公告)号:US20140270050A1

    公开(公告)日:2014-09-18

    申请号:US13904202

    申请日:2013-05-29

    CPC classification number: G06F17/5045 G06F2217/14 G11C19/28

    Abstract: An automated method is provided for designing an integrated circuit. A net list of an integrated circuit design is generated, wherein the net list includes a scan chain having a sequence of individual scan cells. A sequence of two or more individual scan cells of the scan chain is identified as a candidate for replacement by a custom shift array macro cell. The identified sequence of two or more individual scan cells is then replaced with a custom shift array macro cell that provides a functionally equivalent shift function as the replaced sequence of two or more individual scan cells. The custom shift array macro cell includes only two input pins and one output pin.

    Abstract translation: 提供了一种用于设计集成电路的自动化方法。 生成集成电路设计的网络列表,其中网络列表包括具有单独扫描单元的序列的扫描链。 扫描链的两个或多个单独的扫描单元的序列被识别为用于由自定义移位阵列宏小区替换的候选。 然后用自定义移位阵列宏小区替换两个或更多个单个扫描单元的识别序列,其提供功能等同的移位函数作为两个或更多个单独扫描单元的替换序列。 自定义移位阵列宏单元仅包含两个输入引脚和一个输出引脚。

    Deployment of custom shift array macro cells in automated application specific integrated circuit design flow
    2.
    发明授权
    Deployment of custom shift array macro cells in automated application specific integrated circuit design flow 有权
    在自动化专用集成电路设计流程中部署自定义移位阵列宏单元

    公开(公告)号:US08875071B2

    公开(公告)日:2014-10-28

    申请号:US13904202

    申请日:2013-05-29

    CPC classification number: G06F17/5045 G06F2217/14 G11C19/28

    Abstract: An automated method is provided for designing an integrated circuit. A net list of an integrated circuit design is generated, wherein the net list includes a scan chain having a sequence of individual scan cells. A sequence of two or more individual scan cells of the scan chain is identified as a candidate for replacement by a custom shift array macro cell. The identified sequence of two or more individual scan cells is then replaced with a custom shift array macro cell that provides a functionally equivalent shift function as the replaced sequence of two or more individual scan cells. The custom shift array macro cell includes only two input pins and one output pin.

    Abstract translation: 提供了一种用于设计集成电路的自动化方法。 生成集成电路设计的网络列表,其中网络列表包括具有单独扫描单元的序列的扫描链。 扫描链的两个或多个单独的扫描单元的序列被识别为用于由自定义移位阵列宏小区替换的候选。 然后用自定义移位阵列宏小区替换两个或更多个单个扫描单元的识别序列,其提供功能等同的移位函数作为两个或更多个单独扫描单元的替换序列。 自定义移位阵列宏单元仅包含两个输入引脚和一个输出引脚。

    Deployment of transmission gate logic cells in application specific integrated circuits
    3.
    发明授权
    Deployment of transmission gate logic cells in application specific integrated circuits 失效
    传输门逻辑单元在专用集成电路中的设计和部署

    公开(公告)号:US08745558B1

    公开(公告)日:2014-06-03

    申请号:US13755869

    申请日:2013-01-31

    CPC classification number: G06F17/505 G06F17/5045

    Abstract: A method is provided for designing an integrated circuit. The method includes generating a net list of an integrated circuit design, wherein the net list includes one or more component cells selected from a cell library. The component cells include transmission gate logic cells and sourcing cells that drive the transmission gate logic cells. Each transmission gate logic cell has an associated timing model with a timing characteristic defined as a function of a driving strength attribute of a sourcing cell used to characterize the transmission gate logic cell. The method further includes auditing the net list to determine if a given sourcing cell in the integrated circuit design has a sufficient driving strength based at least on the driving strength attribute of a transmission gate logic cell being driven by the given sourcing cell.

    Abstract translation: 提供了一种用于设计集成电路的方法。 该方法包括生成集成电路设计的网络列表,其中网络列表包括从单元库选择的一个或多个组件单元。 组件单元包括传输门逻辑单元和驱动传输门逻辑单元的源单元。 每个传输门逻辑单元具有相关联的定时模型,定时特性被定义为用于表征传输门逻辑单元的源单元的驱动强度属性的函数。 该方法还包括审核网络列表以确定集成电路设计中的给定采购单元是否具有足够的驱动强度,至少基于由给定采购单元驱动的传输门逻辑单元的驱动强度属性。

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