公开(公告)号：US20230114705A1

公开(公告)日：2023-04-13

申请号：US17960246

申请日：2022-10-05

Applicant: Korea Advanced Institute of Science and Technology

Inventor： Yongdae KIM ,  CheolJun PARK ,  Sangwook BAE ,  BeomSeok OH ,  Jiho LEE ,  Mincheol SON ,  Insu YUN

IPC: G06F21/57

Abstract: Disclosed are a negative testing-based security analysis system for protocol implementation of an LTE device, and a method thereof. According to an embodiment, a negative testing-based security analyzing method for protocol implementation of an LTE device performed by a computer device includes redefining a state of user equipment (UE) as a security abstraction state for a negative test and composing a test case generation rule by analyzing a specification document in redefining the state of the UE as the security abstraction state.