公开(公告)号：US20240273701A1

公开(公告)日：2024-08-15

申请号：US18566444

申请日：2022-03-25

Applicant: Konica Minolta, Inc.

Inventor： MIZUHO NISHI ,  YASUHITO WATANABE ,  MINEO TSUSHIMA

IPC: G06T7/00 ,  G01N29/06 ,  G01N29/26 ,  G06T11/00

CPC classification number: G06T7/0004 ,  G01N29/069 ,  G01N29/26 ,  G06T11/006 ,  G01N2291/023 ,  G01N2291/0289 ,  G06T2207/10088 ,  G06T2207/10132 ,  G06T2207/20056 ,  G06T2207/30108

Abstract: A wave motion analysis device 100 that detects a defect of an inspection object on the basis of a reflection wave obtained from the inspection object, and includes a multiple reflection area extraction unit 106 that acquires tomographic data generated on the basis of the reflection wave and extracts, from the tomographic data, a multiple reflection area corresponding to a depth range deeper than a depth at which a real image of the inspection object is able to be detected and being an area in which a multiple reflection signal is able to be mainly detected, and a detection unit 107 that detects a multiple reflection image corresponding to the defect of the inspection object from the extracted multiple reflection area.