公开(公告)号：US20230055954A1

公开(公告)日：2023-02-23

申请号：US17537841

申请日：2021-11-30

Applicant: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Jun-Bo YOON ,  Su-hyun KIM ,  Yong-bok LEE ,  Pan-kyu CHOI ,  Tae-Soo KIM

IPC: G01N19/04 ,  G06F30/23 ,  G06F17/10

Abstract: Disclosed are a method using a sequential contact analysis of a nano-asperity in order to predict an adhesion force between two contacting surfaces and a recording medium recording a program. According to an exemplary embodiment, the method may include: receiving surface roughness data of each of the two target objects; modeling a rough surface based on the surface roughness data; computing an adhesion force value when the two target objects contact and a deformation value of the first nano-asperity; determining whether a next contact is established; iteratively performing the computing and the determining when the deformation value of the first nano-asperity is larger than the separation distance of the next nano-asperity; and determining that a next contact is not established and computing and outputting force adhesion force in a final contact situation, when the deformation value of the first nano-asperity is smaller than the separation distance of the next nano-asperity.