Abstract:
A thickness measuring instrument is disclosed which is of the optical type and adapted for transparent workpieces such as plastic or glass sheets or containers. The instrument utilizes a light beam which is reflected from both front and rear surfaces of the workpiece to be measured and the separation between the reflected beams is taken as a measure of the thickness. The separation between reflected beams is measured by means of a fixed linear array of sensors in the form of photodiodes which are electronically scanned to produce trigger voltages with time intervals therebetween corresponding to the distance between reflected beams. A measurement circuit in either analog or digital form accepts the trigger signals and converts the time interval therebetween into a digital signal or an analog voltage which corresponds to the thickness being measured.
Abstract:
A distance compensated reflectance sensor is presented having a hand held sensing unit for sensing reflectance from surfaces to be measured and generating a signal thereof to be delivered to a main unit where the signal is compared with preset standards or limits for generation of a warning signal if the measured reflectance departs from desired values. The hand held sensor element has a light source, a detector element, and a baffle structure. The baffle provides a partial overlap of the illuminated field and the viewing field, to provide for automatic compensation in the event of the deviation in distance between the surface being examined and the detector element. The source, the detector, and the baffle are arranged so that all direct and directly reflected light are blocked from the detector, i.e., the detector sees only scattered light.