Position measuring device and method for determining an absolute position
    1.
    发明授权
    Position measuring device and method for determining an absolute position 有权
    位置测量装置和确定绝对位置的方法

    公开(公告)号:US08902434B2

    公开(公告)日:2014-12-02

    申请号:US13817774

    申请日:2011-08-19

    摘要: A position measuring apparatus with at least one material measure comprised of an optical structure of an arrangement of 3-D reflectors, at least one light receiver arranged at a distance from the material measure, a light source arranged at a distance from the material measure and at a distance from the light receiver, and at least one transparent substrate present between the material measure and the light receiver, wherein the light receiver is deposited directly on the transparent substrate, on the side of the substrate opposite the material measure in the form of a thin-film structure consisting of several layers arranged one above another. A supporting plate is provided with circuit-board conductors, on which the substrate is arranged, wherein the transparent substrate and the supporting plate are joined solidly together by a Flip-Chip assembly process.

    摘要翻译: 一种具有至少一种材料测量装置的位置测量装置,包括3-D反射器的结构的光学结构,与材料测量距离设置的至少一个光接收器,与材料测量距离设置的光源和 在光接收器的一定距离处,以及存在于材料测量和光接收器之间的至少一个透明衬底,其中光接收器直接沉积在透明衬底上,与衬底相反的材料侧面以 由多个彼此排列的层组成的薄膜结构。 支撑板设置有布置有基板的电路板导体,其中透明基板和支撑板通过倒装芯片组装工艺牢固地接合在一起。

    Position measuring device
    2.
    发明授权
    Position measuring device 有权
    位置测量装置

    公开(公告)号:US08982361B2

    公开(公告)日:2015-03-17

    申请号:US13817781

    申请日:2011-08-19

    摘要: A position measuring apparatus with at least one material measure comprised of an optical structure of an arrangement of 3-D reflectors, at least one light receiver arranged at a distance from the material measure, a light source arranged at a distance from the material measure and at a distance from the light receiver, and at least one transparent substrate present between the material measure and the light receiver, wherein the light receiver is deposited directly on the transparent substrate, on the side of the substrate opposite the material measure in the form of a thin-film structure consisting of several layers arranged one above another. A supporting plate is provided with circuit-board conductors, on which the substrate is arranged, wherein the transparent substrate and the supporting plate are joined solidly together by a Flip-Chip assembly process.

    摘要翻译: 一种具有至少一种材料测量装置的位置测量装置,包括3-D反射器的结构的光学结构,与材料测量距离设置的至少一个光接收器,与材料测量距离设置的光源和 在光接收器的一定距离处,以及存在于材料测量和光接收器之间的至少一个透明衬底,其中光接收器直接沉积在透明衬底上,与衬底相反的材料侧面以 由多个彼此排列的层组成的薄膜结构。 支撑板设置有布置有基板的电路板导体,其中透明基板和支撑板通过倒装芯片组装工艺牢固地连接在一起。

    SENSOR HEAD HOLDER
    3.
    发明申请
    SENSOR HEAD HOLDER 审中-公开
    传感器头架

    公开(公告)号:US20130148132A1

    公开(公告)日:2013-06-13

    申请号:US13817786

    申请日:2011-08-19

    IPC分类号: G01B11/00

    摘要: A position measuring device comprises a housing, a sensor head with a light receiver element arranged in the housing and a rotatable material measure with optical elements at a distance from the sensor head. The material measure is arranged on a rotary encoder mounted on a shaft of a motor. The light receiver element interacts with the optical elements to produce a signal. A sensor head holder has a keyed connection with the housing and the sensor head The housing, the sensor head holder and the sensor head are configured so that their keyed connection establishes the defined position of the light receiver element relative to the optical elements.

    摘要翻译: 位置测量装置包括壳体,具有布置在壳体中的光接收器元件的传感器头部以及与传感器头距离一定距离的光学元件的可旋转材料测量。 材料测量安装在安装在电动机轴上的旋转编码器上。 光接收器元件与光学元件相互作用以产生信号。 传感器头保持器具有与壳体和传感器头的键合连接。壳体,传感器头保持器和传感器头被构造成使得它们的键合连接确定光接收器元件相对于光学元件的限定位置。

    POSITION MEASURING DEVICE AND METHOD FOR DETERMINING AN ABSOLUTE POSITION
    4.
    发明申请
    POSITION MEASURING DEVICE AND METHOD FOR DETERMINING AN ABSOLUTE POSITION 有权
    位置测量装置和确定绝对位置的方法

    公开(公告)号:US20130148131A1

    公开(公告)日:2013-06-13

    申请号:US13817774

    申请日:2011-08-19

    IPC分类号: G01B11/14

    摘要: A position measuring apparatus with at least one material measure comprised of an optical structure of an arrangement of 3-D reflectors, at least one light receiver arranged at a distance from the material measure, a light source arranged at a distance from the material measure and at a distance from the light receiver, and at least one transparent substrate present between the material measure and the light receiver, wherein the light receiver is deposited directly on the transparent substrate, on the side of the substrate opposite the material measure in the form of a thin-film structure consisting of several layers arranged one above another. A supporting plate is provided with circuit-board conductors, on which the substrate is arranged, wherein the transparent substrate and the supporting plate are joined solidly together by a Flip-Chip assembly process.

    摘要翻译: 一种具有至少一种材料测量装置的位置测量装置,包括3-D反射器的结构的光学结构,与材料测量距离设置的至少一个光接收器,与材料测量距离设置的光源和 在光接收器的一定距离处,以及存在于材料测量和光接收器之间的至少一个透明衬底,其中光接收器直接沉积在透明衬底上,与衬底相反的材料侧面以 由多个彼此排列的层组成的薄膜结构。 支撑板设置有布置有基板的电路板导体,其中透明基板和支撑板通过倒装芯片组装工艺牢固地接合在一起。

    POSITION MEASURING DEVICE
    5.
    发明申请
    POSITION MEASURING DEVICE 审中-公开
    位置测量装置

    公开(公告)号:US20130146755A1

    公开(公告)日:2013-06-13

    申请号:US13817789

    申请日:2011-08-19

    IPC分类号: G01D5/347

    摘要: A position measuring device comprises a sensor with a light source and a light receiver element arranged in a housing, a rotary encoder, and a reflective material measure with optical elements provided at a distance from the sensor, the material measure being arranged on the rotary encoder. The sensor is mounted on a plate that has a keyed connection to the housing. The rotary encoder is arranged between the housing and the plate.The rotary encoder has a shaft support or is connected to a shaft support, with the shaft support arranged on the same side of the rotary encoder as the material measure and the plate having a recess for the shaft support.

    摘要翻译: 位置测量装置包括具有光源的传感器和布置在壳体中的光接收器元件,旋转编码器和具有与传感器距离设置的光学元件的反射材料测量,该材料测量装置设置在旋转编码器 。 该传感器安装在与外壳有键合连接的板上。 旋转编码器布置在壳体和板之间。 旋转编码器具有轴支撑件或连接到轴支撑件,轴支撑件布置在与材料测量件在旋转编码器相同的侧上,并且板具有用于轴支撑件的凹部。

    POSITION MEASURING DEVICE
    6.
    发明申请
    POSITION MEASURING DEVICE 有权
    位置测量装置

    公开(公告)号:US20130155420A1

    公开(公告)日:2013-06-20

    申请号:US13817781

    申请日:2011-08-19

    IPC分类号: G01D5/347

    摘要: A position measuring apparatus with at least one material measure comprised of an optical structure of an arrangement of 3-D reflectors, at least one light receiver arranged at a distance from the material measure, a light source arranged at a distance from the material measure and at a distance from the light receiver, and at least one transparent substrate present between the material measure and the light receiver, wherein the light receiver is deposited directly on the transparent substrate, on the side of the substrate opposite the material measure in the form of a thin-film structure consisting of several layers arranged one above another. A supporting plate is provided with circuit-board conductors, on which the substrate is arranged, wherein the transparent substrate and the supporting plate are joined solidly together by a Flip-Chip assembly process.

    摘要翻译: 一种具有至少一种材料测量装置的位置测量装置,包括3-D反射器的结构的光学结构,与材料测量距离设置的至少一个光接收器,与材料测量距离设置的光源和 在光接收器的一定距离处,以及存在于材料测量和光接收器之间的至少一个透明衬底,其中光接收器直接沉积在透明衬底上,与衬底相反的材料侧面以 由多个彼此排列的层组成的薄膜结构。 支撑板设置有布置有基板的电路板导体,其中透明基板和支撑板通过倒装芯片组装工艺牢固地接合在一起。

    Movement and position measuring device and method
    7.
    发明授权
    Movement and position measuring device and method 失效
    运动和位置测量装置及方法

    公开(公告)号:US06172753B2

    公开(公告)日:2001-01-09

    申请号:US08809068

    申请日:1997-03-14

    IPC分类号: G01B1114

    CPC分类号: G01D5/34707

    摘要: A method and a device for detecting a position of a graduation support relative to a support of the device in a direction of displacement of the graduation support and the support relative to each other. The device has a light source. The support has a high resolution graduation consisting of a sequence or array of optical elements focusing the light beam sensing plane on a support on which light-sensitive sensing elements are arranged so that the displacement of the graduation support in relation to the sensing plane can be assessed with precision. The light flux is modified by the graduation and intercepts at least the entire width of an optical element such that the light energy is converted into an alternating signal representing the position of the graduation support in relation to the support. The device is suitable for producing high resolution sensors with simple elements which are easy to manufacture.

    摘要翻译: 一种方法和装置,用于在相对于彼此的刻度支撑件和支撑件的移位方向上检测刻度支撑件相对于装置的支撑件的位置。 该设备具有光源。 该支撑具有高分辨率刻度,其包括将光束感测平面聚焦在其上布置有感光感测元件的支撑件上的顺序或阵列的光学元件,使得刻度支撑件相对于感测平面的位移可以是 精确评估。 通过刻度修改光通量并且至少截取光学元件的整个宽度,使得光能被转换成代表相对于支撑件的刻度支撑件的位置的交替信号。 该器件适用于制造易于制造的简单元件的高分辨率传感器。