Abstract:
A solid state imaging device includes an array of active pixels and an infrared cut filter formed over the sensor. Optionally, a slot in the infrared cut filter allows infrared illumination to reach the sensor to be detected by pixels covered by a visually opaque filter and surrounded by pixels of special types that limit charge leakage and enable high dynamic range sensing of infrared illumination. A ratio of average infrared signal to average brightness indicates an amount of infrared illumination reaching the imaging device.
Abstract:
A solid state imaging device includes an array of active pixels and an infrared cut filter formed over the sensor. Optionally, a slot in the infrared cut filter allows infrared illumination to reach the sensor to be detected by pixels covered by a visually opaque filter and surrounded by pixels of special types that limit charge leakage and enable high dynamic range sensing of infrared illumination. A ratio of average infrared signal to average brightness indicates an amount of infrared illumination reaching the imaging device.
Abstract:
A solid state imaging device includes an array of active pixels and an infrared cut filter formed over the sensor. Optionally, a slot in the infrared cut filter allows infrared illumination to reach the sensor to be detected by pixels covered by a visually opaque filter and surrounded by pixels of special types that limit charge leakage and enable high dynamic range sensing of infrared illumination. A ratio of average infrared signal to average brightness indicates an amount of infrared illumination reaching the imaging device.
Abstract:
A solid state imaging device includes an array of active pixels and an infrared cut filter formed over the sensor. Optionally, a slot in the infrared cut filter allows infrared illumination to reach the sensor to be detected by pixels covered by a visually opaque filter and surrounded by pixels of special types that limit charge leakage and enable high dynamic range sensing of infrared illumination. A ratio of average infrared signal to average brightness indicates an amount of infrared illumination reaching the imaging device.
Abstract:
Methods and apparatuses for noise reduction of imager pixels signals. A weighted combination based on the presence of edges of two calculated demosaiced signals is used to produce a noise reduced signal. The noise reduced signal may be sharpened based on a calculated luminance of the two demosaiced signals.
Abstract:
Method, apparatus and system for determining a value for green-green imbalance and applying the value to green pixels to correct the imbalance are described. Average pixel values of green pixels within a kernel are calculated and an imbalance value is determined based on the averages. The imbalance value is added to or subtracted from all green pixel response values in the kernel to correct the imbalance.
Abstract:
A method and apparatus are provided for determining which pixels of a plurality of pixels have outputs which are reflecting of the color temperature of a light source. Those pixels which are determined to be representative of a light source may be used in a white balance operation. In the method and apparatus of the invention, the pixels are examined for a relationship among the color components (e.g., R, G, B) of a pixel which meet a predetermined criteria. Those pixels which meet the criteria are used in a white balance operation.
Abstract:
An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.
Abstract:
An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.
Abstract:
Methods and apparatuses for noise reduction include embodiments that use a weighted combination based on the presence of edges of two calculated demosaiced signals to produce a noise reduced signal. The noise reduced signal may be sharpened based on a calculated luminance of the two demosaiced signals.