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公开(公告)号:US20140136135A1
公开(公告)日:2014-05-15
申请号:US14078129
申请日:2013-11-12
申请人: IMAGE INSIGHT INC.
发明人: Gordon A. DRUKIER , Eric P. RUBENSTEIN , Yonatan B. RUBENSTEIN , Joshua C. KESSLER , Peter R. SOLOMON , Marek A. WOJTOWICZ
IPC分类号: G01D18/00
CPC分类号: G01T7/005
摘要: Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.
摘要翻译: 本文描述了用于校准多个电子设备的系统和方法。 这样的方法可以包括由处理器获得来自多个参考电子设备的数据,由处理器分析数据,并且由处理器基于从多个参考电子设备获得的分析数据来校准电子设备 。
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公开(公告)号:US20230152478A1
公开(公告)日:2023-05-18
申请号:US17869159
申请日:2022-07-20
申请人: IMAGE INSIGHT INC.
发明人: Gordon A. DRUKIER , Eric P. RUBENSTEIN , Yonatan B. RUBENSTEIN , Joshua C. KESSLER , Peter R. SOLOMON , Marek A. WOJTOWICZ
IPC分类号: G01T7/00
摘要: Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.
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