Method for Training Artificial Intelligence Model and Related Device

    公开(公告)号:US20240211758A1

    公开(公告)日:2024-06-27

    申请号:US18596134

    申请日:2024-03-05

    CPC classification number: G06N3/08 G06N3/0495

    Abstract: A method for training an artificial intelligence (AI) model includes receiving a first training subtask at a first training unit, obtaining, by executing the first training subtask using a plurality of first training subunits, a first weight that is obtained through synchronization among the plurality of first training subunits, asynchronously receiving a second weight that is obtained by executing a second training subtask by at least one second training unit, and obtaining a weight of the AI model based on the first weight and the second weight.

    APPLICATION PERFORMANCE TEST METHOD AND APPARATUS, AND METHOD AND APPARATUS FOR ESTABLISHING PERFORMANCE TEST MODEL

    公开(公告)号:US20240241808A1

    公开(公告)日:2024-07-18

    申请号:US18616076

    申请日:2024-03-25

    CPC classification number: G06F11/3466

    Abstract: In an application performance testing method, a testing device obtains running status data of an application running on a computing chip and a memory access volume of each data access path of the computing chip in a running process of the application. The computing chip includes a plurality of memory units, and the data access path represents an access path between the memory units. The testing device determines running performance information of the application based on the running status data and the memory access volume of each data access path, and obtains a test result of the application based on the running performance information of the application and a performance test model established for the computing chip. The performance test model includes a performance test line of each data access path.

    Optical module and detection circuit thereof

    公开(公告)号:US09998227B2

    公开(公告)日:2018-06-12

    申请号:US14059750

    申请日:2013-10-22

    CPC classification number: H04B10/50575 G01R19/00 H04B10/588

    Abstract: The present invention discloses an optical module and a detection circuit thereof. The detection circuit includes: a sampling module, including a first potentiometer configured to convert a sampling current into a sampling voltage; an amplifying module, coupled to an output end of the sampling module and configured to amplify the sampling voltage; and an analog-to-digital conversion module, coupled to an output end of the amplifying module and configured to convert the amplified sampling voltage into a digital signal for detection. By arranging a potentiometer in a sampling module of a detection circuit, a resistance value of the sampling module can be adjusted, thereby adapting to responsivities of different modulators, increasing the locking speed of a modulator, preventing horizontal shifts of a locking point and a false locking point, and reducing the occupied PCB area.

    OPTICAL MODULE AND DETECTION CIRCUIT THEREOF
    5.
    发明申请
    OPTICAL MODULE AND DETECTION CIRCUIT THEREOF 有权
    光模块及其检测电路

    公开(公告)号:US20140119723A1

    公开(公告)日:2014-05-01

    申请号:US14059750

    申请日:2013-10-22

    CPC classification number: H04B10/50575 G01R19/00 H04B10/588

    Abstract: The present invention discloses an optical module and a detection circuit thereof. The detection circuit includes: a sampling module, including a first potentiometer configured to convert a sampling current into a sampling voltage; an amplifying module, coupled to an output end of the sampling module and configured to amplify the sampling voltage; and an analog-to-digital conversion module, coupled to an output end of the amplifying module and configured to convert the amplified sampling voltage into a digital signal for detection. By arranging a potentiometer in a sampling module of a detection circuit, a resistance value of the sampling module can be adjusted, thereby adapting to responsivities of different modulators, increasing the locking speed of a modulator, preventing horizontal shifts of a locking point and a false locking point, and reducing the occupied PCB area.

    Abstract translation: 本发明公开了一种光模块及其检测电路。 检测电路包括:采样模块,包括被配置为将采样电流转换成采样电压的第一电位器; 放大模块,耦合到采样模块的输出端并被配置为放大采样电压; 以及模数转换模块,耦合到放大模块的输出端并被配置为将放大的采样电压转换成用于检测的数字信号。 通过在检测电路的采样模块中配置电位器,可以调整采样模块的电阻值,从而适应不同调制器的响应性,增加调制器的锁定速度,防止锁定点的水平移位和假 锁定点,减少占用的PCB面积。

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