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公开(公告)号：US11290975B2
公开(公告)日：2022-03-29
申请号：US16791795
申请日：2020-02-14
Applicant: Huawei Technologies Co., Ltd.
Inventor： Fangzhou Zhu , Mingxuan Yuan , Jia Zeng , Weixiong Rao
Abstract: A method for obtaining an emission probability includes obtaining a plurality of measurement reports (MRs) of a terminal in a target region and an engineering parameter of at least one base station in the target region, obtaining, based on parameter information in each of the plurality of MRs and the engineering parameter of the at least one base station, a feature vector corresponding to each of the plurality of MRs, processing, using a regression model, location information in each of the plurality of MRs and the feature vector corresponding to each of the plurality of MRs, to obtain a single-point positioning model, calculating, based on the single-point positioning model, the location information in each of the plurality of MRs, and the feature vector corresponding to each of the plurality of MRs, an emission probability of the feature vector corresponding to each of the plurality of MRs.
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公开(公告)号：US12047902B2
公开(公告)日：2024-07-23
申请号：US17688087
申请日：2022-03-07
Applicant: Huawei Technologies Co., Ltd.
Inventor： Fangzhou Zhu , Mingxuan Yuan , Jia Zeng , Weixiong Rao
IPC: H04W64/00 , G06N20/00 , H04W24/10 , H04W72/0446 , H04W76/11
CPC classification number: H04W64/003 , G06N20/00 , H04W24/10 , H04W72/0446 , H04W76/11
Abstract: A method for obtaining an emission probability includes obtaining a plurality of measurement reports (MRs) of a terminal in a target region and an engineering parameter of at least one base station in the target region, obtaining, based on parameter information in each of the plurality of MRs and the engineering parameter of the at least one base station, a feature vector corresponding to each of the plurality of MRs, processing, using a regression model, location information in each of the plurality of MRs and the feature vector corresponding to each of the plurality of MRs, to obtain a single-point positioning model, calculating, based on the single-point positioning model, the location information in each of the plurality of MRs, and the feature vector corresponding to each of the plurality of MRs, an emission probability of the feature vector corresponding to each of the plurality of MRs.
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公开(公告)号：US20220191818A1
公开(公告)日：2022-06-16
申请号：US17688087
申请日：2022-03-07
Applicant: Huawei Technologies Co., Ltd.
Inventor： Fangzhou Zhu , Mingxuan Yuan , Jia Zeng , Weixiong Rao
Abstract: A method for obtaining an emission probability includes obtaining a plurality of measurement reports (MRs) of a terminal in a target region and an engineering parameter of at least one base station in the target region, obtaining, based on parameter information in each of the plurality of MRs and the engineering parameter of the at least one base station, a feature vector corresponding to each of the plurality of MRs, processing, using a regression model, location information in each of the plurality of MRs and the feature vector corresponding to each of the plurality of MRs, to obtain a single-point positioning model, calculating, based on the single-point positioning model, the location information in each of the plurality of MRs, and the feature vector corresponding to each of the plurality of MRs, an emission probability of the feature vector corresponding to each of the plurality of MRs.
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公开(公告)号：US20200187149A1
公开(公告)日：2020-06-11
申请号：US16791795
申请日：2020-02-14
Applicant: Huawei Technologies Co., Ltd.
Inventor： Fangzhou Zhu , Mingxuan Yuan , Jia Zeng , Weixiong Rao
Abstract: A method for obtaining an emission probability includes obtaining a plurality of measurement reports (MRs) of a terminal in a target region and an engineering parameter of at least one base station in the target region, obtaining, based on parameter information in each of the plurality of MRs and the engineering parameter of the at least one base station, a feature vector corresponding to each of the plurality of MRs, processing, using a regression model, location information in each of the plurality of MRs and the feature vector corresponding to each of the plurality of MRs, to obtain a single-point positioning model, calculating, based on the single-point positioning model, the location information in each of the plurality of MRs, and the feature vector corresponding to each of the plurality of MRs, an emission probability of the feature vector corresponding to each of the plurality of MRs.
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