公开(公告)号：US11210770B2

公开(公告)日：2021-12-28

申请号：US16355419

申请日：2019-03-15

Applicant: Hitachi, Ltd.

Inventor： Maria Teresa Gonzalez Diaz ,  Dipanjan Ghosh ,  Adriano Arantes ,  Michiko Yoshida ,  Jiro Hashizume ,  Chetan Gupta ,  Phawis Thammasorn

IPC: G06T7/00 ,  G06T7/70 ,  G06K9/62

Abstract: Example implementations described herein involve defect analysis for images received from a camera system, which can involve applying a first model configured to determine regions of interest of the object from the images, applying a second model configured to identify localized areas of the object based on the regions of interest on the images; and applying a third model configured to identify defects in the localized ones of the images.

公开(公告)号：US10082456B2

公开(公告)日：2018-09-25

申请号：US14962334

申请日：2015-12-08

Applicant: Hitachi, Ltd.

Inventor： Jiro Hashizume ,  Kei Takenaka ,  Takanori Aono

IPC: G01N21/17

CPC classification number: G01N21/171 ,  G01N2021/1712

Abstract: The present invention includes: an excitation light source; a probe light source; a filter that mutually multiplexes a probe light emitted from the probe light source and an excitation light emitted from the excitation light source to a same optical axis; a condenser lens that focuses the excitation light and the probe light; a sample cell that stores a sample; a reflection member that is disposed on an inner wall of the sample cell and reflects the probe light; and a detector that detects the probe light reflected at the reflection member.