公开(公告)号：US10466297B2

公开(公告)日：2019-11-05

申请号：US15663002

申请日：2017-07-28

Applicant: HUAWEI TECHNOLOGIES CO., LTD.

Inventor： Jianping Deng ,  Cheng Zeng ,  Qingsong Zhu

IPC: G01R31/08 ,  G01R31/28 ,  G01B7/16 ,  G01R27/08 ,  G01R31/3183

Abstract: An integrated circuit detection method, apparatus, and system are disclosed, which relate to the field of electronics and resolve a problem of detecting an electrical parameter of an integrated circuit on a printed circuit board in a power-on state. A specific solution is as follows: N detection circuits (101) are disposed, where each detection circuit (101) is connected to a different integrated circuit (102), the detection circuit (101) is provided with a first detection point (a) and a second detection point (b), and the detection circuit (101) is configured to detect the electrical parameter of the integrated circuit (102) that is connected to the detection circuit (101); and N is an integer greater than or equal to 1. The solution is used in a process of detecting the electrical parameter of the integrated circuit on the printed circuit board.