公开(公告)号：US20240377421A1

公开(公告)日：2024-11-14

申请号：US18691169

申请日：2022-09-13

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Naohiko Fukaya ,  Masayuki Ito ,  Masashi Akutsu

IPC: G01N35/00 ,  G01N35/02

Abstract: Provided is an automatic analyzer including: an operation terminal; an analyzer having an active examination function of executing, in parallel with an initial examination, a re-examination possibly required after the initial examination on the same specimen; and a computer configured to communicate with the analyzer, in which the computer executes determination processing as to whether an analysis time is shorter when the active examination function is enabled than when the active examination function is disabled based on performance data of an examination executed in the past, and outputs determination data of the determination processing to the operation terminal or the analyzer.

公开(公告)号：US12085581B2

公开(公告)日：2024-09-10

申请号：US17274797

申请日：2019-11-12

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Masayuki Ito ,  Osamu Matsumoto ,  Ryota Watanabe

IPC: G01N35/00 ,  G01N35/10

CPC classification number: G01N35/00871 ,  G01N35/00732 ,  G01N35/1002

Abstract: The automatic analyzer includes a first storage device that stores sample information including a measurement result of a reaction solution for each sample and a second storage device that stores the sample information on at least a part of the samples among the sample information stored in the first storage device, in which when the automatic analyzer reaches a predetermined operation state, the control device performs a backup process of backing up the sample information on the samples satisfying a predetermined backup condition from the first storage device to the second storage device, and deleting the sample information on the backed up samples from the first storage device.