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公开(公告)号：US20240054617A1
公开(公告)日：2024-02-15
申请号：US18270897
申请日：2021-10-07
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Satoshi TSUCHIYA , Tatsuya ONISHI , Toshiyasu SUYAMA
CPC classification number: G06T5/002 , A61B6/4291 , A61B6/5258 , G06T2207/10116 , G06T2207/20081 , G06T2207/20084
Abstract: A control device 20 includes an image acquisition unit 203 configured to acquire a radiographic image obtained by irradiating a subject F with radiation and capturing an image of the radiation passing through the subject F, a noise map generation unit 204 configured to derive an evaluation value obtained by evaluating spread of a noise value from a pixel value of each pixel in the radiographic image on the basis of relationship data indicating a relationship between the pixel value and the evaluation value and generate a noise map that is data in which the derived evaluation value is associated with each pixel in the radiographic image, and a processing unit 205 configured to input the radiographic image and the noise map to a trained model 207 constructed in advance through machine learning and execute image processing of removing noise from the radiographic image.
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公开(公告)号：US20230136930A1
公开(公告)日：2023-05-04
申请号：US17918397
申请日：2021-04-14
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Toshiyasu SUYAMA , Tatsuya ONISHI
IPC: G01N23/083 , G01N23/04 , G01T1/208
Abstract: A control device includes an acquisition unit configured to acquire X-ray transmission images of a jig and a target object using an image acquisition device that radiates X-rays to the target object and captures an image of the X-rays passing through the target object to acquire an X-ray transmission image, a specification unit configured to specify image characteristics of the X-ray transmission image of the jig, a selection unit configured to select a trained model on the basis of the image characteristics from a plurality of trained models constructed through machine training in advance using image data, and a processing unit configured to execute image processing for removing noise from the X-ray transmission image of the target object using the selected trained model.
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3.发明公开公开(公告)号：US20240210331A1
公开(公告)日：2024-06-27
申请号：US18576210
申请日：2022-04-06
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Tatsuya ONISHI , Toshiyasu SUYAMA , Satoshi TSUCHIYA
IPC: G01N23/04 , G01N23/083 , G01T1/20 , G06T5/70 , G06T7/00
CPC classification number: G01N23/04 , G01N23/083 , G01T1/20184 , G06T5/70 , G06T7/0012 , G01N2223/3308 , G01N2223/401 , G06T2207/10116 , G06T2207/20081 , G06T2207/20084
Abstract: An image acquiring device includes a camera that scans radiation passing through a subject in one direction and captures an image of the radiation to acquire an X-ray image, a scintillator layer provided on the camera to convert X-rays into light, and a control device that executes noise removal processing of removing noise from the X-ray image. The camera includes N (N is an integer equal to or greater than 2) pixels arrayed in a direction orthogonal to the one direction to detect the light and output detection signals, and a readout circuit that outputs the X-ray image by outputting the detection signal for each of the N pixels. The scintillator layer includes P (P is an integer equal to or greater than 2) scintillator units disposed separately to correspond to the N pixels and a separation unit disposed between the P scintillator units.
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公开(公告)号：US20140211918A1
公开(公告)日：2014-07-31
申请号：US14228813
申请日：2014-03-28
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Toshiyasu SUYAMA , Mototsugu SUGIYAMA
CPC classification number: G21K4/00 , B82Y10/00 , G01N23/04 , G01T1/2008 , G01T3/06 , G21K2201/061
Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.
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公开(公告)号：US20230288349A1
公开(公告)日：2023-09-14
申请号：US18016699
申请日：2021-04-30
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Kunihiko TSUCHIYA , Toshiyasu SUYAMA
IPC: G01N23/18 , G01N21/90 , G01N23/04 , G01N21/33 , G01N21/3563 , G01N23/083
CPC classification number: G01N23/18 , G01N21/90 , G01N23/04 , G01N21/33 , G01N21/3563 , G01N23/083 , G01N2223/643
Abstract: A foreign matter inspection device includes: an X-ray application unit configured to apply an X-ray to an inspection object carried by a carriage unit; an X-ray detection unit configured to detect an X-ray transmitted by the inspection object and to output X-ray image data based on the detection result; an infrared ray application unit configured to apply an infrared ray to the inspection object carried by the carriage unit; and an infrared ray detection unit configured to detect the infrared ray from the inspection object and to output infrared image data based on the detection result. The infrared ray application unit and the infrared ray detection unit are covered by a protection unit formed of a member blocking the X-ray and transmitting the infrared ray.
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Patent Agency Ranking
公开(公告)号：US20230125182A1
公开(公告)日：2023-04-27
申请号：US17918178
申请日：2021-04-14
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Tatsuya ONISHI , Toshiyasu SUYAMA
Abstract: A control device includes an input unit configured to accept an input of condition information indicating either operating conditions of a source of X-rays when the X-rays are radiated to capture an image of a target object or imaging conditions during capturing an image of the target object, a calculation unit configured to calculate average energy of the X-rays passing through the target object on the basis of the condition information, and a narrowing unit configured to narrow down candidates for a trained model from a plurality of trained models constructed through machine training in advance using image data on the basis of the average energy.
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公开(公告)号：US20200292718A1
公开(公告)日：2020-09-17
申请号：US16890325
申请日：2020-06-02
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Mototsugu SUGIYAMA , Tatsuya ONISHI , Toshiyasu SUYAMA
Abstract: A radiation image acquisition system includes a radiation source that outputs radiation toward an object, a scintillator that has an input surface to which the radiation output from the radiation source and transmitted through the object is input, converts the radiation input to the input surface into scintillation light, and is opaque to the scintillation light, an image capturing means that includes a lens portion focused on the input surface and configured to image the scintillation light output from the input surface and an image capturing unit configured to capture an image of the scintillation light imaged by the lens portion and outputs radiation image data of the object A, and an image generating unit that generates a radiation image of the object based on the radiation image data output from the image capturing means.
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公开(公告)号：US20180306931A1
公开(公告)日：2018-10-25
申请号：US15764439
申请日：2016-07-29
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Mototsugu SUGIYAMA , Tatsuya ONISHI , Toshiyasu SUYAMA
Abstract: A radiation image acquisition system includes a radiation source that outputs radiation toward an object, a scintillator that has an input surface to which the radiation output from the radiation source and transmitted through the object is input, converts the radiation input to the input surface into scintillation light, and is opaque to the scintillation light, an image capturing means that includes a lens portion focused on the input surface and configured to image the scintillation light output from the input surface and an image capturing unit configured to capture an image of the scintillation light imaged by the lens portion and outputs radiation image data of the object A, and an image generating unit that generates a radiation image of the object based on the radiation image data output from the image capturing means.
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公开(公告)号：US20230128795A1
公开(公告)日：2023-04-27
申请号：US17918168
申请日：2021-04-05
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Tatsuya ONISHI , Toshiyasu SUYAMA
Abstract: A radiographic inspection apparatus acquires a first image and a second image; receives an input of selection of a region of interest in the first image or the second image; specifies respective first pixel values of a plurality of first pixels and respective second pixel values of a plurality of second pixels corresponding to the plurality of first pixels, and calculates a thickness correction function by approximating a relationship between the first pixel values and the second pixel values; calculates a plurality of representative data each of which is a combination of a first representative value and a second representative value on the basis of the respective first pixel values of the plurality of first pixels and the respective second pixel values of the plurality of second pixels; and calculates an evaluation coefficient based on a correlation between the thickness correction function and the plurality of calculated representative data.
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公开(公告)号：US20220141397A1
公开(公告)日：2022-05-05
申请号：US17310820
申请日：2019-12-23
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Mototsugu SUGIYAMA , Toshiyasu SUYAMA , Haruki SUZUKI
Abstract: An imaging unit includes a housing having a wall portion in which a slit for passing radiation is formed, a scintillator having an input surface to which radiation passing through the slit is input, a first mirror that reflects scintillation light output from the input surface, and a line scan camera that detects scintillation light reflected by the first mirror. The scintillator is placed to make the input surface parallel to both the conveying direction and a line direction. The first mirror is positioned outside an irradiation region connecting the peripheral edge of the slit to the input surface of the scintillator.
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