公开(公告)号：US20250116732A1

公开(公告)日：2025-04-10

申请号：US18565891

申请日：2022-09-22

Applicant: Google LLC

Inventor： Shandor Glenn Dektor ,  Martin Johannes Kraemer ,  Mark Fralick ,  Chuck Tally

IPC: G01R33/00

Abstract: Methods, systems, and apparatus, for calibration quality control using multiple magnetometers. One of the methods includes: receiving measurements by two or more magnetic field sensors of a device over a period of time, wherein each measurement measures a magnetic field at each magnetic field sensor, wherein each measurement at each time point over the period of time includes a vector in one or more spatial axes of a three-dimensional space; computing a difference between the measurements over the period of time, wherein the difference at each time point over the period of time is a result of computing a difference based on one or more pairs of the vectors at the time point; determining that the difference does not remain within a predetermined range over the period of time; and in response, classifying calibration quality of the device as unsuitable for computing a heading of the device.